Ara es mostren els items 39-47 de 47

    • Test of dual axis accelerometers based on specifications compliance 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Universidad de Navarra, 2013)
      Text en actes de congrés
      Accés obert
    • Testing IC accelerometers using Lissajous compositions 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Micro Electro Mechanical devices (MEMs) have widened their range of applications in a spectacular way in the last years. Reliability of MEMs devices is one of the areas that need to be improved to achieve high volume ...
    • Time series RUL estimation of medium voltage connectors to ease predictive maintenance plans 

      Gómez Pau, Álvaro; Riba Ruiz, Jordi-Roger; Moreno Eguilaz, Juan Manuel (2020-12-17)
      Article
      Accés obert
      The ageing process of medium voltage power connectors can lead to important power system faults. An on-line prediction of the remaining useful life (RUL) is a convenient strategy to prevent such failures, thus easing the ...
    • Transient noise failures in SRAM cells: dynamic noise margin metric 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Current nanometric IC processes need to assess the robustness of memories under any possible source of disturbance: process and mismatch variations, bulk noises, supply rings variations, temperature changes, aging and ...
    • True random number generator based on RRAM-bias current starved ring oscillator 

      Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca (Institute of Electrical and Electronics Engineers (IEEE), 2023-09-29)
      Article
      Accés obert
      This work presents a RRAM-bias current starved ring oscillator (CSRO) as TRNG, where the cycle-to-cycle variability of a RRAM device is exploited as source of randomness. A simple voltage divider composed of this RRAM and ...
    • True random number generator based on the variability of the high resistance state of RRAMs 

      Akbari, Maryam; Mirzakuchaki, Sattar; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Campabadal, Francesca; Bargalló González, Mireia; Rodríguez Montañés, Rosa (Institute of Electrical and Electronics Engineers (IEEE), 2023-01-01)
      Article
      Accés obert
      Hardware-based security primitives like True Random Number Generators (TRNG) have become a crucial part in protecting data over communication channels. With the growth of internet and cloud storage, TRNGs are required in ...
    • Unpredictable bits generation based on RRAM parallel configuration 

      Arumi Delgado, Daniel; Gómez Pau, Álvaro; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bargalló, Mireia; Campabadal, Francesca (2018-12-12)
      Article
      Accés obert
      In this letter a cell with the parallel combination of two TiN/Ti/HfO2/W resistive random access memory (RRAM) devices is studied for the generation of unpredictable bits. Measurements confirm that a simultaneous parallel ...
    • Uprating of transmission lines by means of HTLS conductors for a sustainable growth: challenges, opportunities, and research needs 

      Riba Ruiz, Jordi-Roger; Bogarra Rodríguez, Santiago; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (2020-12-01)
      Article
      Accés obert
      This paper provides a comprehensive and critical review and evaluation of the technological state-of-the-art of high-temperature low-sag (HTLS) conductors by analyzing research articles, theses, reports, white papers and ...
    • Verifying analog circuits based on a digital signature 

      Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2009)
      Comunicació de congrés
      Accés obert
      Verification of analog circuit specifications is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost parameter verification based on statistical ...