Exploració per autor "Gómez Pau, Álvaro"
Ara es mostren els items 22-41 de 47
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M-S test based on specification validation using octrees in the measure space
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
Text en actes de congrés
Accés restringit per política de l'editorialTesting M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ... -
Mixed-signal alternate test and binning using digitally encoded signatures
Gómez Pau, Álvaro (Universitat Politècnica de Catalunya, 2017-07-11)
Tesi
Accés obertIntegrated circuit industry has always faced the necessity of testing and verifying the fabricated ICs in order to guarantee that no faulty circuits reach the market as well as the fabricated devices function within design ... -
Mixed-signal test band guarding using digitally coded indirect measurements
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
Text en actes de congrés
Accés restringit per política de l'editorialTesting analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ... -
Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
Article
Accés restringit per política de l'editorialOne of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ... -
Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
Text en actes de congrés
Accés restringit per política de l'editorialMicroelectromechanical systems production is still an immature technology compared to the classical semiconductor industry. MEMS fabrication and packaging processes may present misalignments which result in an improper ... -
On the fitting and improvement of RRAM stanford-based model parameters using TiN/Ti/HfO2/W experimental data
Mahboubi, Vahab; Arumi Delgado, Daniel; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2022)
Comunicació de congrés
Accés restringit per política de l'editorialThe use of Resistive Random Access Memory (RRAM) devices is becoming pervasive in many applications. In particular, security based primitives can exploit their variability and non-volatility for generating cells for ... -
On-line remaining useful life estimation of power connectors focused on predictive maintenance
Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Martínez Reyes, Jimmy Arturo; Moreno Eguilaz, Juan Manuel (Multidisciplinary Digital Publishing Institute (MDPI), 2021-05-27)
Article
Accés obertConnections are critical elements in power systems, exhibiting higher failure probability. Power connectors are considered secondary simple devices in power systems despite their key role, since a failure in one such element ... -
Programming techniques of resistive random-access memory devices for neuromorphic computing
Machado Panadés, Pau; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Arumi Delgado, Daniel (2023-11-27)
Article
Accés obertNeuromorphic computing offers a promising solution to overcome the von Neumann bottleneck, where the separation between the memory and the processor poses increasing limitations of latency and power consumption. For this ... -
Quality metrics for mixed-signal indirect testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
Text en actes de congrés
Accés obert -
Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums
Gómez Pau, Álvaro; Banerjee, Suvadeep; Chatterjee, Abhijit (Institute of Electrical and Electronics Engineers (IEEE), 2014)
Text en actes de congrés
Accés restringit per política de l'editorialAnalog circuits are sensitive to signal aggressions and power supply noise, crosstalk coupling and alpha particle strikes can cause significant degradation of circuit's SNR. This research proposes a novel approach to ... -
RRAM random number generator based on train of pulses
Yang, Binbin; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Fang, Liang (2021-07-30)
Article
Accés obertIn this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude ... -
Sensor comparison for corona discharge detection under low pressure conditions
Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (2020-06-01)
Article
Accés obertLow pressure environments, situate insulation systems in a challenging position since partial discharges (PDs), corona and arc tracking are more likely to develop. Therefore, specific solutions are required to detect such ... -
Serial RRAM cell for secure bit concealing
Yang, Binbin; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Fang, Liang (2021-07-31)
Article
Accés obertNon-volatile memory cells are exposed to adversary attacks since any active countermeasure is useless when the device is powered off. In this context, this work proposes the association of two serial RRAM devices as a basic ... -
Simulation of serial RRAM cell based on a Verilog-A compact model
Yang, Binbin; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bautista Roldan, Juan; Bargalló González, Mireia; Campabadal, Francesca; Fang, Liang (Institute of Electrical and Electronics Engineers (IEEE), 2021)
Text en actes de congrés
Accés restringit per política de l'editorialModel-based simulation is one of the effective methods of scientific research. The inherent variability of resistive switching mechanisms has been an obstacle for the massive commercial implementation of the resistive ... -
Sistemes combinacionals : Introducció a les funcions lògiques i a la minimització d’expressions
Gómez Pau, Álvaro; Manich Bou, Salvador (Universitat Politècnica de Catalunya, 2017)
Apunts
Accés obert -
SRAM cell stability metric under transient voltage noise
Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2013-12-20)
Article
Accés restringit per política de l'editorial -
SRAM stability metric under transient noise
Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2012)
Text en actes de congrés
Accés obertventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like process and mi smatch variations, bulk noises, supply rings variations, ... -
Test of dual axis accelerometers based on specifications compliance
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Universidad de Navarra, 2013)
Text en actes de congrés
Accés obert -
Testing IC accelerometers using Lissajous compositions
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
Text en actes de congrés
Accés restringit per política de l'editorialMicro Electro Mechanical devices (MEMs) have widened their range of applications in a spectacular way in the last years. Reliability of MEMs devices is one of the areas that need to be improved to achieve high volume ... -
Time series RUL estimation of medium voltage connectors to ease predictive maintenance plans
Gómez Pau, Álvaro; Riba Ruiz, Jordi-Roger; Moreno Eguilaz, Juan Manuel (2020-12-17)
Article
Accés obertThe ageing process of medium voltage power connectors can lead to important power system faults. An on-line prediction of the remaining useful life (RUL) is a convenient strategy to prevent such failures, thus easing the ...