Ara es mostren els items 22-41 de 47

    • M-S test based on specification validation using octrees in the measure space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ...
    • Mixed-signal alternate test and binning using digitally encoded signatures 

      Gómez Pau, Álvaro (Universitat Politècnica de Catalunya, 2017-07-11)
      Tesi
      Accés obert
      Integrated circuit industry has always faced the necessity of testing and verifying the fabricated ICs in order to guarantee that no faulty circuits reach the market as well as the fabricated devices function within design ...
    • Mixed-signal test band guarding using digitally coded indirect measurements 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
    • Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
      Article
      Accés restringit per política de l'editorial
      One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ...
    • Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Microelectromechanical systems production is still an immature technology compared to the classical semiconductor industry. MEMS fabrication and packaging processes may present misalignments which result in an improper ...
    • On the fitting and improvement of RRAM stanford-based model parameters using TiN/Ti/HfO2/W experimental data 

      Mahboubi, Vahab; Arumi Delgado, Daniel; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2022)
      Comunicació de congrés
      Accés restringit per política de l'editorial
      The use of Resistive Random Access Memory (RRAM) devices is becoming pervasive in many applications. In particular, security based primitives can exploit their variability and non-volatility for generating cells for ...
    • On-line remaining useful life estimation of power connectors focused on predictive maintenance 

      Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Martínez Reyes, Jimmy Arturo; Moreno Eguilaz, Juan Manuel (Multidisciplinary Digital Publishing Institute (MDPI), 2021-05-27)
      Article
      Accés obert
      Connections are critical elements in power systems, exhibiting higher failure probability. Power connectors are considered secondary simple devices in power systems despite their key role, since a failure in one such element ...
    • Programming techniques of resistive random-access memory devices for neuromorphic computing 

      Machado Panadés, Pau; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Arumi Delgado, Daniel (2023-11-27)
      Article
      Accés obert
      Neuromorphic computing offers a promising solution to overcome the von Neumann bottleneck, where the separation between the memory and the processor poses increasing limitations of latency and power consumption. For this ...
    • Quality metrics for mixed-signal indirect testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
      Text en actes de congrés
      Accés obert
    • Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums 

      Gómez Pau, Álvaro; Banerjee, Suvadeep; Chatterjee, Abhijit (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Analog circuits are sensitive to signal aggressions and power supply noise, crosstalk coupling and alpha particle strikes can cause significant degradation of circuit's SNR. This research proposes a novel approach to ...
    • RRAM random number generator based on train of pulses 

      Yang, Binbin; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Fang, Liang (2021-07-30)
      Article
      Accés obert
      In this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude ...
    • Sensor comparison for corona discharge detection under low pressure conditions 

      Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (2020-06-01)
      Article
      Accés obert
      Low pressure environments, situate insulation systems in a challenging position since partial discharges (PDs), corona and arc tracking are more likely to develop. Therefore, specific solutions are required to detect such ...
    • Serial RRAM cell for secure bit concealing 

      Yang, Binbin; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Fang, Liang (2021-07-31)
      Article
      Accés obert
      Non-volatile memory cells are exposed to adversary attacks since any active countermeasure is useless when the device is powered off. In this context, this work proposes the association of two serial RRAM devices as a basic ...
    • Simulation of serial RRAM cell based on a Verilog-A compact model 

      Yang, Binbin; Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bautista Roldan, Juan; Bargalló González, Mireia; Campabadal, Francesca; Fang, Liang (Institute of Electrical and Electronics Engineers (IEEE), 2021)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Model-based simulation is one of the effective methods of scientific research. The inherent variability of resistive switching mechanisms has been an obstacle for the massive commercial implementation of the resistive ...
    • Sistemes combinacionals : Introducció a les funcions lògiques i a la minimització d’expressions 

      Gómez Pau, Álvaro; Manich Bou, Salvador (Universitat Politècnica de Catalunya, 2017)
      Apunts
      Accés obert
    • SRAM cell stability metric under transient voltage noise 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2013-12-20)
      Article
      Accés restringit per política de l'editorial
    • SRAM stability metric under transient noise 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2012)
      Text en actes de congrés
      Accés obert
      ventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like process and mi smatch variations, bulk noises, supply rings variations, ...
    • Test of dual axis accelerometers based on specifications compliance 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Universidad de Navarra, 2013)
      Text en actes de congrés
      Accés obert
    • Testing IC accelerometers using Lissajous compositions 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Micro Electro Mechanical devices (MEMs) have widened their range of applications in a spectacular way in the last years. Reliability of MEMs devices is one of the areas that need to be improved to achieve high volume ...
    • Time series RUL estimation of medium voltage connectors to ease predictive maintenance plans 

      Gómez Pau, Álvaro; Riba Ruiz, Jordi-Roger; Moreno Eguilaz, Juan Manuel (2020-12-17)
      Article
      Accés obert
      The ageing process of medium voltage power connectors can lead to important power system faults. An on-line prediction of the remaining useful life (RUL) is a convenient strategy to prevent such failures, thus easing the ...