Ara es mostren els items 10-29 de 47

    • Design, Fabrication and Veri cation of a Mixed-Signal XY Zone Monitoring Circuit and its Application to a Phase Lock Loop Circuit 

      Gómez Pau, Álvaro (Universitat Politècnica de Catalunya, 2010-06)
      Projecte/Treball Final de Carrera
      Accés obert
      El presente proyecto de final de carrera se centra en el diseño, análisis e implementación en silicio de una metodología de test/diagnosis basada en la comparación de firmas digitales generadas a partir de curvas de ...
    • Digital signature generator for mixed-signal testing 

      Sanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2009)
      Text en actes de congrés
      Accés obert
      Es presenta un nou generador de signatures digitals per controlar dues senyals anàlogues. Es presenta la tecnologia STM 65 nm per demostrar la viabilitat de la proposta.
    • Efficient production binning using octree tessellation in the alternate measurements space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2015)
      Article
      Accés obert
      Binning after volume production is a widely accepted technique to classify fabricated ICs into different clusters depending on different degrees of specification compliance. This allows the manufacturer to sell non optimal ...
    • Error resilient real-time state variable systems signal processing and control 

      Banerjee, Suvadeep; Gómez Pau, Álvaro; Chatterjee, Abhijit; Abraham, Jacob (2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
    • ETS 2022 ORGANIZING COMMITTEE 

      Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bernardi, Paolo; Tille, Daniel; Mir, Salvador; Bosio, Alberto; Arumi Delgado, Daniel; Gómez Pau, Álvaro; Cassano, Luca; Jiao, Hailong; Miclea, Liviu; Sanchez, Ernesto; Savino, Alessandro; Canal Corretger, Ramon; Eggersglüß, Stephan; Fransi, Sergi; Taouil, Mottaqiallah; Calomarde Palomino, Antonio; Weiner, Michael; Michael, Maria K.; Sonza Reorda, Matteo; Larsson, Erik; Vatajelu, Elena-Ioana; Stratigopoulos, Haralampos-G.; Parisi Baradad, Vicenç; Jiao, Hailong; Huang, Junlin; Li, Huawei; Chillarige, Sameer; Kameyama, Shuichi; Carro, Luigi; Su, Fei; Nicolici, Nicola; Huang, Shi-Yu (2022-05)
      Text en actes de congrés
      Accés obert
    • Experimental study of the corona performance of aged sand-cast substation connectors 

      Riba Ruiz, Jordi-Roger; Bogarra Rodríguez, Santiago; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (2020-06-01)
      Article
      Accés obert
      Substation connectors, like many other high-voltage products, are tested once manufactured. However, the corona behavior of aged specimens can differ from that exhibited by newer ones, thus generating detrimental technical ...
    • Experimental study of visual corona under aeronautic pressure conditions using low-cost imaging sensors 

      Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (Multidisciplinary Digital Publishing Institute (MDPI), 2020-01-11)
      Article
      Accés obert
      Visual corona tests have been broadly applied for identifying the critical corona points of diverse high-voltage devices, although other approaches based on partial discharge or radio interference voltage measurements are ...
    • Identification of component deviations in analog circuits using digital signatures 

      Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Analog circuits component diagnosis is a challenging task requiring expensive resources. This paper presents a low cost method to identify deviations in multiple component values using a precharacterisation of the impact ...
    • Impact of laser attacks on the switching behavior of RRAM devices 

      Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Montilla, Víctor; Hernández, David; Bargalló González, Mireia; Campabadal, Francesca (2020-01-20)
      Article
      Accés obert
      The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative ...
    • Improving indirect test efficiency using multi-directional tessellations in the measure space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the ...
    • Indirect and adaptive test of analogue circuits based on preselected steady-state response measures 

      Gómez Pau, Álvaro; Lupón Roses, Emilio; Balado Suárez, Luz María; Figueras, Joan (2020-08-01)
      Article
      Accés obert
      Alternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively ...
    • Indirect test of M-S circuits using multiple specification band guarding 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016-09-01)
      Article
      Accés obert
      Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
    • M-S test based on specification validation using octrees in the measure space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ...
    • Mixed-signal alternate test and binning using digitally encoded signatures 

      Gómez Pau, Álvaro (Universitat Politècnica de Catalunya, 2017-07-11)
      Tesi
      Accés obert
      Integrated circuit industry has always faced the necessity of testing and verifying the fabricated ICs in order to guarantee that no faulty circuits reach the market as well as the fabricated devices function within design ...
    • Mixed-signal test band guarding using digitally coded indirect measurements 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
    • Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
      Article
      Accés restringit per política de l'editorial
      One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ...
    • Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Microelectromechanical systems production is still an immature technology compared to the classical semiconductor industry. MEMS fabrication and packaging processes may present misalignments which result in an improper ...
    • On the fitting and improvement of RRAM stanford-based model parameters using TiN/Ti/HfO2/W experimental data 

      Mahboubi, Vahab; Arumi Delgado, Daniel; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2022)
      Comunicació de congrés
      Accés restringit per política de l'editorial
      The use of Resistive Random Access Memory (RRAM) devices is becoming pervasive in many applications. In particular, security based primitives can exploit their variability and non-volatility for generating cells for ...
    • On-line remaining useful life estimation of power connectors focused on predictive maintenance 

      Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Martínez Reyes, Jimmy Arturo; Moreno Eguilaz, Juan Manuel (Multidisciplinary Digital Publishing Institute (MDPI), 2021-05-27)
      Article
      Accés obert
      Connections are critical elements in power systems, exhibiting higher failure probability. Power connectors are considered secondary simple devices in power systems despite their key role, since a failure in one such element ...
    • Programming techniques of resistive random-access memory devices for neuromorphic computing 

      Machado Panadés, Pau; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Bargalló González, Mireia; Campabadal, Francesca; Arumi Delgado, Daniel (2023-11-27)
      Article
      Accés obert
      Neuromorphic computing offers a promising solution to overcome the von Neumann bottleneck, where the separation between the memory and the processor poses increasing limitations of latency and power consumption. For this ...