Exploració per autor "Maya Sánchez, Mª del Carmen"

Ara es mostren els items 5-7 de 7

    • Extraction of an avalanche diode noise model for its application as on-wafer noise source 

      Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís (JOHN WILEY & SONS INC, 2003-07-31)
      Article
      Accés obert
      This paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on-wafer noise source. It is based on the determination of a broadband device noise ...

    • Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources 

      Lázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís (HORIZON HOUSE PUBLICATIONS INC, 2002-03-31)
      Article
      Accés obert
      The authors present a method for calibrating the four noise parameters of a noise receiver which does not require a tuner The method permits using general (mismatched) noise sources, which may present very different source ...

    • Noise model of a reverse-biased Cold-FET applied to the characterization of its ENR 

      Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís (JOHN WILEY & SONS INC, 2004-02-28)
      Article
      Accés obert
      This paper presents a broadband-noise circuit model for a cold-FET (Vds = 0 V) with a reverse-biased gate. The noise model includes two intrinsic uncorrelated noise-current sources whose spectral densities are determined ...