Ara es mostren els items 21-40 de 86

    • Electronic properties of intrinsic and doped amorphous silicon carbide films 

      Vetter, Michael; Voz Sánchez, Cristóbal; Ferré Tomas, Rafel; Martín García, Isidro; Orpella García, Alberto; Puigdollers i González, Joaquim; Andreu Batallé, Jordi; Alcubilla González, Ramón (2006-07)
      Article
      Accés restringit per política de l'editorial
      Hydrogenated amorphous silicon carbide (a-SiCx : H) films have shown excellent surface passivation of crystalline silicon. With the aim of large area deposition of these films the influence of the rf plasma power was ...
    • Electronic transport in low temperature nanocrystalline silicon thin-film transistors obtained by hot-wire CVD 

      Puigdollers i González, Joaquim; Voz Sánchez, Cristóbal; Orpella García, Alberto; Martín García, Isidro; Soler Vilamitjana, David; Fonrodona, Marta; Bertomeu Balaguero, Joan; Andreu Batallé, Jordi; Alcubilla González, Ramón (2002-04)
      Article
      Accés restringit per política de l'editorial
      Hydrogenated nanocrystalline silicon (nc-Si:H) obtained by hot-wire chemical vapour deposition (HWCVD) at low substrate temperature (150 °C) has been incorporated as the active layer in bottom-gate thin-film transistors ...
    • Emitter formation using laser doping technique on n- and p-type c-Si substrates 

      López Rodríguez, Gema; Ortega Villasclaras, Pablo Rafael; Colina Brito, Mónica Alejandra; Voz Sánchez, Cristóbal; Morales Vilches, Ana Belén; Orpella García, Alberto; Alcubilla González, Ramón (2015-05-01)
      Article
      Accés obert
      In this work laser doping technique is used to create highly-doped regions defined in a point-like structure to form n+/p and p+/n junctions applying a pulsed Nd-YAG 1064 nm laser in the n ...
    • Examen Final 

      Orpella García, Alberto; Ortega Villasclaras, Pablo Rafael (Universitat Politècnica de Catalunya, 2022-01-07)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Altet Sanahujes, Josep; Bermejo Broto, Sandra; Fernández Chimeno, Mireya; Martín García, Isidro; Orpella García, Alberto; Ortega Villasclaras, Pablo Rafael; Prat Viñas, Lluís; Puigdollers i González, Joaquim; Rodríguez Martínez, Ángel; Voz Sánchez, Cristóbal (Universitat Politècnica de Catalunya, 2013-01-08)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Orpella García, Alberto; Turó Peroy, Antonio (Universitat Politècnica de Catalunya, 2021-01-21)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Orpella García, Alberto; Voz Sánchez, Cristóbal (Universitat Politècnica de Catalunya, 2017-06-13)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Orpella García, Alberto; Pol Fernández, Clemente; Turó Peroy, Antonio (Universitat Politècnica de Catalunya, 2022-01-18)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Chávez Domínguez, Juan Antonio; Orpella García, Alberto; Ortega Villasclaras, Pablo Rafael; López González, Juan Miguel; Turó Peroy, Antonio (Universitat Politècnica de Catalunya, 2023-06-06)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Garcies Salvà, Pau; López González, Juan Miguel; Orpella García, Alberto; Ortega Villasclaras, Pablo Rafael; Turó Peroy, Antonio; Vidal López, Eva María (Universitat Politècnica de Catalunya, 2015-01-16)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Guede Fernández, Federico; García González, Miguel Ángel; López, J. M.; Orpella García, Alberto; Pol Fernández, Clemente; Turó Peroy, Antonio (Universitat Politècnica de Catalunya, 2019-01-16)
      Examen
      Accés restringit a la comunitat UPC
    • EXAMEN FINAL 

      Bogónez Franco, Francisco; Chávez Domínguez, Juan Antonio; Orpella García, Alberto; Turó Peroy, Antonio; López González, Juan Miguel (Universitat Politècnica de Catalunya, 2022-06-01)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Laboratori 

      Chávez Domínguez, Juan Antonio; López González, Juan Miguel; Navarro Pons, Marc; Orpella García, Alberto; Pol Fernández, Clemente (Universitat Politècnica de Catalunya, 2021-06-01)
      Examen
      Accés restringit a la comunitat UPC
    • Experimental determination of base resistance contribution for point-like contacted c-Si solar cells using impedance spectroscopy analysis 

      Orpella García, Alberto; Martín García, Isidro; López González, Juan Miguel; Ortega Villasclaras, Pablo Rafael; Voz Sánchez, Cristóbal; Puigdollers i González, Joaquim; Alcubilla González, Ramón (2015-10)
      Article
      Accés obert
      One of the most common strategies in high-efficiency crystalline silicon (c-Si) solar cells for the rear surface is the combination of a dielectric passivation with a point-like contact to the base. In such devices, the ...
    • Fabrication and characterization of in-situ doped a-Si0.8C0.2 emitter bipolar transistors 

      Orpella García, Alberto; Puigdollers i González, Joaquim; Bardés Llorensí, Daniel; Alcubilla González, Ramón; Marsal, L F; Pallarès Marzal, Josep (2000-09)
      Article
      Accés restringit per política de l'editorial
      Silicon–carbon emitters were deposited by plasma enhanced chemical vapour deposition (PECVD) on a conventional silicon transistor base. The resulting transistors were annealed after the emitter had been deposited which led ...
    • Front contact optimization of industrial scale CIGS solar cells for low solar concentration using 2D physical modeling 

      Delgado Sánchez, José María; López González, Juan Miguel; Orpella García, Alberto; Sánchez-Cortezón, Emilio; Alba, Maria D.; López López, Carmen; Alcubilla González, Ramón (2017-02-01)
      Article
      Accés obert
      Cu(In,Ga)Se2 (CIGS) technology is one of the best absorber materials with record efficiencies among photovoltaic thin-film technologies (22.3% at lab scale and 16% at large commercial module). Although research on this ...
    • Fullerene thin-film transistors fabricated on polymeric gate dielectric 

      Puigdollers i González, Joaquim; Voz Sánchez, Cristóbal; Cheylan, Stephanie; Orpella García, Alberto; Vetter, M; Alcubilla González, Ramón (2007-07)
      Article
      Accés restringit per política de l'editorial
      Thin-film transistors with fullerene as n-type organic semiconductor have been fabricated. A polymeric gate dielectric, polymethyl methacrylate, has been used as an alternative to usual inorganic dielectrics. No significant ...
    • High efficiency interdigitated back-contact c-Si solar cells 

      Calle Martín, Eric; Ortega Villasclaras, Pablo Rafael; López Rodríguez, Gema; Martín García, Isidro; Carrió Díaz, David; Voz Sánchez, Cristóbal; Orpella García, Alberto; Puigdollers i González, Joaquim; Alcubilla González, Ramón (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Text en actes de congrés
      Accés obert
      In this work we describe a baseline fabrication process of interdigitated-back-contact c-Si(p) solar cells, which combines conventional diffusion oven stages to define base p+ and emitter n+ regions at the backside, with ...
    • Impedance modeling of silica nanoparticle metal insulator metal capacitors 

      Véliz Noboa, Bremnen Marino; Bermejo Broto, Sandra; Orpella García, Alberto; Castañer Muñoz, Luis María (2018-08-01)
      Article
      Accés obert
      In this study, we have fabricated metal-insulator-metal (MIM) capacitors where the insulator layer is made of 255¿nm diameter silica nanospheres. The MIM devices have been characterized and modeled by electrochemical ...
    • Impedance spectroscopy interpretation of silica and polystyrene colloidal suspensions 

      Véliz Noboa, Bremnen Marino; Orpella García, Alberto; Domínguez Pumar, Manuel; Bermejo Broto, Sandra (2020-03-01)
      Article
      Accés obert
      Impedance spectroscopy differences between colloidal 295-nm silica and 300-nm polystyrene nanoparticles in deionized water are analyzed in this work. Using two different two-electrode measurement setups, designed for this ...