Ara es mostren els items 28-42 de 42

    • Laboratorio de electrónica : curso básico 

      Aragonès Cervera, Xavier; Casas Piedrafita, Óscar; Guinjoan Gispert, Francisco; Molinas, P.; Navarro González, Eduardo; Turó Peroy, Antonio (Edicions UPC, 2000)
      Llibre
      Accés restringit a la comunitat UPC
      Este libro ha sido elaborado por un equipo de profesores del Departamento de Ingeniería Electrónica de la UPC que imparten dichos contenidos a los estudiantes de primer curso de las titulaciones de Ingeniería de Telecomunicación ...
    • Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements 

      Crespo Yepes, Albert; Ramos Hortal, Regina; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier; Mateo Peña, Diego; Martin Martínez, Javier; Rodríguez Martínez, Rosana; Nafría Maqueda, Montserrat (2021-10-01)
      Article
      Accés obert
      In this work, an ‘on-the-fly’ measurement technique for the monitoring of CMOS inverters performance degradation is presented. This technique allows the characterization of the circuit degradation simultaneously with the ...
    • MOSFET degradation dependence on input signal power in a RF power amplifier 

      Crespo Yepes, Albert; Barajas Ojeda, Enrique; Martin Martínez, Javier; Mateo Peña, Diego; Aragonès Cervera, Xavier; Rodríguez Martínez, Rosana; Nafría Maqueda, Montserrat (2017-06-25)
      Article
      Accés obert
      Aging produced by RF stress is experimentally analyzed on a RF CMOS power amplifier (PA), as a function of the stress power level. The selected circuit topology allows observing individual NMOS and PMOS transistors ...
    • Noise generation and coupling mechanisms in deep-submicron IC's 

      Aragonès Cervera, Xavier; González Jiménez, José Luis; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2002-09)
      Article
      Accés obert
      On-chip noise generation and coupling is an important issue in deep-submicron technologies. Advanced IC technology faces new challenges to ensure function and performance integrity. Selecting adequate test techniques ...
    • On evaluating temperature as observable for CMOS technology variability 

      Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
      Text en actes de congrés
      Accés obert
      The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ...
    • Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling 

      Méndez, M A; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (IEEE, 2005)
      Text en actes de congrés
      Accés obert
      The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the ...
    • Prediction of the impact of substrate coupled switching noise on frequency synthesizers 

      Osorio Tamayo, Juan Felipe; Aragonès Cervera, Xavier (2012-03-01)
      Article
      Accés restringit per política de l'editorial
      This paper proposes a methodology to accurately predict the phase noise effects in frequency synthesizers as a consequence of switching noise coupled through the substrate. The method proposed is based on a phase model of ...
    • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

      Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...
    • Sargantana: an academic SoC RISC-V processor in 22nm FDSOI technology 

      Doblas Font, Max; Candón Arenas, Gerard; Carril Gil, Xavier; Dominguez de la Rocha, Marc; Erra, Enric; González Trejo, Alberto; Jiménez, Víctor; Kostalampros, Ioannis-Vatistas; Langarita Benítez, Rubén; Leyva Santes, Neiel; López Paradís, Guillem; Mendoza Escobar, Jonnatan; Oltra Oltra, Josep Angel; Pavón Rivera, Julián; Ramírez Lazo, Cristóbal; Rodas Quiroga, Narcís; Reggiani, Enrico; Rodriguez, Mario; Rojas Morales, Carlos; Ruiz Ramirez, Abraham Josafat; Safadi Figueroa, Hugo Ernesto; Soria Pardos, Víctor; Vargas Valdivieso, Iván; Arreza, Fernando; Figueras Bagué, Roger; Fontova Muste, Pau; Marimon Illana, Joan; Aragonès Cervera, Xavier; Cristal Kestelman, Adrián; Mateo Peña, Diego; Moll Echeto, Francisco de Borja; Moretó Planas, Miquel; Palomar Pérez, Óscar; Sonmez, Nehir; Unsal, Osman Sabri; Valero Cortés, Mateo (Institute of Electrical and Electronics Engineers (IEEE), 2023)
      Comunicació de congrés
      Accés obert
      This paper describes the Sargantana System on chip (SoC), a 64-bit RISC-V single core processor designed by a number of academic institutions and manufactured in 22 nm FDSOI technology: BSC, UPC, UB, UAB, CIC-IPN and IMB-CNM ...
    • Set-up of Assura RCX-HF tools for the AMS S35 process. Configuration files and usage guide. 

      Aragonès Cervera, Xavier (2008-10-31)
      Report de recerca
      Accés obert
    • Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits 

      Mateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Dídac; Aragonès Cervera, Xavier (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      This paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon ...
    • Temperature sensors and measurements to test analogue circuits: questions and answers 

      Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ...
    • Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; González Jiménez, José Luis; Martineau, B.; Siligaris, Alexandre; Aragonès Cervera, Xavier (2014-04)
      Article
      Accés restringit per política de l'editorial
      This letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The ...
    • Using temperature measurements to enhance security in front of hardware trojans 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier (2023-06-28)
      Report de recerca
      Accés obert
      The goal of this document is to present a review of the work performed to carry out the task 3.5 of the Spanish National Project PID2019-103869RB-C33, entitled “El Reto de la Variabilidad en NANO-CMOS y BEYOND-CMOS: Nuevos ...
    • VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits 

      Méndez Villegas, Miguel Ángel; Osorio Tamayo, Juan Felipe; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
      Text en actes de congrés
      Accés obert
      This paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...