Exploració per autor "Aragonès Cervera, Xavier"
Ara es mostren els items 15-34 de 42
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DC temperature measurements to characterize the central frequency and 3 dB bandwidth in mmW power amplifiers
Aragonès Cervera, Xavier; Mateo Peña, Diego; González Jiménez, José Luis; Vidal López, Eva María; Gómez Salinas, Didac; Martineau, B; Altet Sanahujes, Josep (2015-11)
Article
Accés obertThis letter shows how a temperature sensor and a simple DC voltage multimeter can be used as instruments to determine the central frequency and 3 dB bandwidth of a 60 GHz linear power amplifier (PA). Compared to previous ... -
Desenvolupament d'un sistema de comunicacions integrat per part d'estudiants de 2on cicle de l'ETSETB de la Universitat Politècnica de Catalunya
González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier (Universitat Politècnica de Catalunya. Institut de Ciències de l'Educació, 2005-02)
Text en actes de congrés
Accés obertEl projecte ha consistit en el disseny i fabricació d’un circuit integrat que conté un receptor Bluetooth per a xarxes sense fils en una tecnologia CMOS de 0,35 m. Els objectius del projecte eren realitzar una experiència ... -
Desenvolupament de plataformes docents per a l'adquisició de mesures i el control de processos industrials
Aragonès Cervera, Xavier (2006)
Pòster (projecte CCD)
Accés obert -
Design of a 2.5-GHZ QVCO robust against high frequency substrate noise
Molina Garcia, Marc Manel; Gómez Salinas, Dídac; Aragonès Cervera, Xavier; Mateo Peña, Diego; González Jiménez, José Luis (2011-07)
Article
Accés restringit per política de l'editorialThis work presents the design procedure followed to obtain a low-power voltage-controlled oscillator (VCO) robust against high-frequency substrate noise, using as a demonstrator a 2.5 GHz VCO with quadrature outputs (QVCO) ... -
Design of a broadband CMOS RF power amplifier to establish device-circuit aging correlations
Barajas Ojeda, Enrique; Mateo Peña, Diego; Aragonès Cervera, Xavier; Crespo Yepes, Albert; Rodríguez Martínez, Rosana; Martin Martínez, Javier; Nafría Maqueda, Montserrat (Institute of Electrical and Electronics Engineers (IEEE), 2017)
Text en actes de congrés
Accés restringit per política de l'editorialThis paper presents the design of a Broadband CMOS RF Power Amplifier, suitable to be stressed at circuit level but with the possibility to be measured both at circuit and at device level. It allows establishing a relation ... -
Differential temperature sensors: Review of applications in the test and characterization of circuits, usage and design methodology
Barajas Ojeda, Enrique; Aragonès Cervera, Xavier; Mateo Peña, Diego; Altet Sanahujes, Josep (Multidisciplinary Digital Publishing Institute (MDPI), 2019-11-05)
Article
Accés obertDifferential temperature sensors can be placed in integrated circuits to extract a signature ofthe power dissipated by the adjacent circuit blocks built in the same silicon die. This review paper firstdiscusses the singularity ... -
Diseño de circuitos y sistemas integrados
Rubio Sola, Jose Antonio; Altet Sanahujes, Josep; Aragonès Cervera, Xavier; González Jiménez, José Luis; Mateo Peña, Diego; Moll Echeto, Francisco de Borja (Edicions UPC, 2000)
Llibre
Accés restringit a la comunitat UPCLa tecnología de circuitos integrados, basada principalmente en la miniaturización de los circuitos -con el incremento de prestaciones y la fuerte reducción de costos consiguientes– ha evolucionado intensamente en los ... -
Diseño de circuitos y sistemas integrados
Rubio Sola, Jose Antonio; Altet Sanahujes, Josep; Aragonès Cervera, Xavier; González Jiménez, José Luis; Mateo Peña, Diego; Moll Echeto, Francisco de Borja (Edicions UPC, 2003)
Llibre
Accés restringit als usuaris de la UB, UAB, UPC, UPF, UdG, UdL, URV, UOC, BC, UVic, UJI, URL, UICLa tecnología de circuitos integrados, basada principalmente en la miniaturización de los circuitos ha evolucionado intensamente en los últimos tiempos. El objetivo de esta obra es dar a conocer esta evolución reciente y ... -
Effect of high frequency substrate noise on LC-VCOs
Molina Garcia, Marc Manel; Aragonès Cervera, Xavier; Mateo Peña, Diego; González Jiménez, José Luis (IEEE Press. Institute of Electrical and Electronics Engineers, 2010)
Text en actes de congrés
Accés obertThis paper presents an experimental analysis of the performance degradation of an LC-Voltage Controlled Oscillator (LC-VCO) produced by high frequency noise present in the substrate. The spurs observed are shown to be ... -
Examen Final
Aragonès Cervera, Xavier (Universitat Politècnica de Catalunya, 2017-01-11)
Examen
Accés restringit a la comunitat UPC -
Examen Final
Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Altet Sanahujes, Josep; Gómez, Sergio (Universitat Politècnica de Catalunya, 2013-06-26)
Examen
Accés restringit a la comunitat UPC -
Examen Final
Vidal López, Eva María; Aragonès Cervera, Xavier (Universitat Politècnica de Catalunya, 2013-06-19)
Examen
Accés restringit a la comunitat UPC -
Inductor shielding strategies to protect mmW LC-VCOs from high frequency substrate noise
Molina García, Marc; Aragonès Cervera, Xavier; Mateo Peña, Diego; González Jiménez, José Luis (2013-05-01)
Article
Accés restringit per política de l'editorialThis paper analyzes the impact of high-frequency substrate noise on two 60 GHz LC-VCOs that implement different strategies for inductor shielding, namely floating and grounded shields. An analytical model, which has ... -
Laboratorio de electrónica : curso básico
Aragonès Cervera, Xavier; Casas Piedrafita, Óscar; Guinjoan Gispert, Francisco; Molinas, P.; Navarro González, Eduardo; Turó Peroy, Antonio (Edicions UPC, 2000)
Llibre
Accés restringit a la comunitat UPCEste libro ha sido elaborado por un equipo de profesores del Departamento de Ingeniería Electrónica de la UPC que imparten dichos contenidos a los estudiantes de primer curso de las titulaciones de Ingeniería de Telecomunicación ... -
Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements
Crespo Yepes, Albert; Ramos Hortal, Regina; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier; Mateo Peña, Diego; Martin Martínez, Javier; Rodríguez Martínez, Rosana; Nafría Maqueda, Montserrat (2021-10-01)
Article
Accés obertIn this work, an ‘on-the-fly’ measurement technique for the monitoring of CMOS inverters performance degradation is presented. This technique allows the characterization of the circuit degradation simultaneously with the ... -
MOSFET degradation dependence on input signal power in a RF power amplifier
Crespo Yepes, Albert; Barajas Ojeda, Enrique; Martin Martínez, Javier; Mateo Peña, Diego; Aragonès Cervera, Xavier; Rodríguez Martínez, Rosana; Nafría Maqueda, Montserrat (2017-06-25)
Article
Accés obertAging produced by RF stress is experimentally analyzed on a RF CMOS power amplifier (PA), as a function of the stress power level. The selected circuit topology allows observing individual NMOS and PMOS transistors ... -
Noise generation and coupling mechanisms in deep-submicron IC's
Aragonès Cervera, Xavier; González Jiménez, José Luis; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2002-09)
Article
Accés obertOn-chip noise generation and coupling is an important issue in deep-submicron technologies. Advanced IC technology faces new challenges to ensure function and performance integrity. Selecting adequate test techniques ... -
On evaluating temperature as observable for CMOS technology variability
Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
Text en actes de congrés
Accés obertThe temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ... -
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling
Méndez, M A; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (IEEE, 2005)
Text en actes de congrés
Accés obertThe present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the ... -
Prediction of the impact of substrate coupled switching noise on frequency synthesizers
Osorio Tamayo, Juan Felipe; Aragonès Cervera, Xavier (2012-03-01)
Article
Accés restringit per política de l'editorialThis paper proposes a methodology to accurately predict the phase noise effects in frequency synthesizers as a consequence of switching noise coupled through the substrate. The method proposed is based on a phase model of ...