Exploració per autor "Mateo Peña, Diego"
Ara es mostren els items 61-63 de 63
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Using temperature as observable of the frequency response of RF CMOS amplifiers
(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Text en actes de congrés
Accés obertThe power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ... -
Using temperature measurements to enhance security in front of hardware trojans
(2023-06-28)
Report de recerca
Accés obertThe goal of this document is to present a review of the work performed to carry out the task 3.5 of the Spanish National Project PID2019-103869RB-C33, entitled “El Reto de la Variabilidad en NANO-CMOS y BEYOND-CMOS: Nuevos ... -
VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits
(Institute of Electrical and Electronics Engineers (IEEE), 2006)
Text en actes de congrés
Accés obertThis paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...
