Ara es mostren els items 57-63 de 63

    • Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits 

      Mateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Dídac; Aragonès Cervera, Xavier (2013)
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      Accés restringit per política de l'editorial
      This paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon ...
    • Temperature sensors and measurements to test analogue circuits: questions and answers 

      Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
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      Accés restringit per política de l'editorial
      We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ...
    • Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; González Jiménez, José Luis; Martineau, B.; Siligaris, Alexandre; Aragonès Cervera, Xavier (2014-04)
      Article
      Accés restringit per política de l'editorial
      This letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The ...
    • Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor (2010)
      Text en actes de congrés
      Accés obert
      In this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits.
    • Using temperature as observable of the frequency response of RF CMOS amplifiers 

      Aldrete Vidrio, Héctor; Slhi, M A; Altet Sanahujes, Josep; Gruby, S; Mateo Peña, Diego; Michel, H; Clerjaud, L; Rampnous, J M; Rubio Sola, Jose Antonio; Claeys, Wilfrid; Dilhaire, W Claeys I S (Institute of Electrical and Electronics Engineers (IEEE), 2008)
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      Accés obert
      The power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ...
    • Using temperature measurements to enhance security in front of hardware trojans 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier (2023-06-28)
      Report de recerca
      Accés obert
      The goal of this document is to present a review of the work performed to carry out the task 3.5 of the Spanish National Project PID2019-103869RB-C33, entitled “El Reto de la Variabilidad en NANO-CMOS y BEYOND-CMOS: Nuevos ...
    • VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits 

      Méndez Villegas, Miguel Ángel; Osorio Tamayo, Juan Felipe; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
      Text en actes de congrés
      Accés obert
      This paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...