Exploració per autor "Mateo Peña, Diego"
Ara es mostren els items 57-63 de 63
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Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits
Mateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Dídac; Aragonès Cervera, Xavier (2013)
Text en actes de congrés
Accés restringit per política de l'editorialThis paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon ... -
Temperature sensors and measurements to test analogue circuits: questions and answers
Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
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Accés restringit per política de l'editorialWe have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ... -
Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers
Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; González Jiménez, José Luis; Martineau, B.; Siligaris, Alexandre; Aragonès Cervera, Xavier (2014-04)
Article
Accés restringit per política de l'editorialThis letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The ... -
Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits
Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor (2010)
Text en actes de congrés
Accés obertIn this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits. -
Using temperature as observable of the frequency response of RF CMOS amplifiers
Aldrete Vidrio, Héctor; Slhi, M A; Altet Sanahujes, Josep; Gruby, S; Mateo Peña, Diego; Michel, H; Clerjaud, L; Rampnous, J M; Rubio Sola, Jose Antonio; Claeys, Wilfrid; Dilhaire, W Claeys I S (Institute of Electrical and Electronics Engineers (IEEE), 2008)
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Accés obertThe power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ... -
Using temperature measurements to enhance security in front of hardware trojans
Altet Sanahujes, Josep; Mateo Peña, Diego; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier (2023-06-28)
Report de recerca
Accés obertThe goal of this document is to present a review of the work performed to carry out the task 3.5 of the Spanish National Project PID2019-103869RB-C33, entitled “El Reto de la Variabilidad en NANO-CMOS y BEYOND-CMOS: Nuevos ... -
VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits
Méndez Villegas, Miguel Ángel; Osorio Tamayo, Juan Felipe; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
Text en actes de congrés
Accés obertThis paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...