Ara es mostren els items 46-63 de 63

    • Non-invasive Monitoring of CMOS Power Amplifiers Operating at RF and mmW Frequencies using an On-chip Thermal Sensor 

      González Jiménez, José Luis; Martineau, Baudouin; Mateo Peña, Diego; Altet Sanahujes, Josep (IEEE Press. Institute of Electrical and Electronics Engineers, 2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      In this paper a non-invasive, contact-less technique for the on-chip observation of PA operation is presented. It uses a differential temperature sensor that transduces the temperature increase due to the power dissipated ...
    • Non-invasive RF built-in testing using on-chip temperature sensors 

      Aldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (IEEE Computer Society Publications, 2009-11)
      Altres
      Accés obert
      This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
    • On evaluating temperature as observable for CMOS technology variability 

      Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
      Text en actes de congrés
      Accés obert
      The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ...
    • On line monitoring of RF power amplifiers with embedded temperature sensors 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac (IEEE, 2012)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      In the present paper we analyze that DC temperature measurements of the silicon surface can be used to monitor the high frequency status and performances of class A RF Power Amplifiers. As a proof of concept, we present ...
    • On the use of static temperature measurements as process variation observable 

      Gómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego (2012-10)
      Article
      Accés restringit per política de l'editorial
      In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, ...
    • Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling 

      Méndez, M A; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (IEEE, 2005)
      Text en actes de congrés
      Accés obert
      The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the ...
    • Providing an UWB-IR BAN wireless communications network and its application to design a low power transceiver in CMOS technology 

      Barajas Ojeda, Enrique; Mateo Peña, Diego; González Jiménez, José Luis (Universitat Politècnica de Catalunya, 2010)
      Text en actes de congrés
      Accés obert
      Ultra Wide-Band (UWB) communication techniques have received increasing attention since United States Federal Communications Commission (FCC) adopted a “First Report and Order” in 2002. Unfortunately the regulations that ...
    • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

      Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
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      This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...
    • Sargantana: an academic SoC RISC-V processor in 22nm FDSOI technology 

      Doblas Font, Max; Candón Arenas, Gerard; Carril Gil, Xavier; Dominguez de la Rocha, Marc; Erra, Enric; González Trejo, Alberto; Jiménez, Víctor; Kostalampros, Ioannis-Vatistas; Langarita Benítez, Rubén; Leyva Santes, Neiel; López Paradís, Guillem; Mendoza Escobar, Jonnatan; Oltra Oltra, Josep Angel; Pavón Rivera, Julián; Ramírez Lazo, Cristóbal; Rodas Quiroga, Narcís; Reggiani, Enrico; Rodriguez, Mario; Rojas Morales, Carlos; Ruiz Ramirez, Abraham Josafat; Safadi Figueroa, Hugo Ernesto; Soria Pardos, Víctor; Vargas Valdivieso, Iván; Arreza, Fernando; Figueras Bagué, Roger; Fontova Muste, Pau; Marimon Illana, Joan; Aragonès Cervera, Xavier; Cristal Kestelman, Adrián; Mateo Peña, Diego; Moll Echeto, Francisco de Borja; Moretó Planas, Miquel; Palomar Pérez, Óscar; Sonmez, Nehir; Unsal, Osman Sabri; Valero Cortés, Mateo (Institute of Electrical and Electronics Engineers (IEEE), 2023)
      Comunicació de congrés
      Accés obert
      This paper describes the Sargantana System on chip (SoC), a 64-bit RISC-V single core processor designed by a number of academic institutions and manufactured in 22 nm FDSOI technology: BSC, UPC, UB, UAB, CIC-IPN and IMB-CNM ...
    • Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements 

      Aldrete Vidrio, Eduardo; Mateo Peña, Diego; Altet Sanahujes, Josep; Amine Salhi, M.; Grauby, Stéphane; Dilhaire, Stefan; Onabajo, M.; Silva-Martínez, José (2010-06-08)
      Article
      Accés obert
      This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and ...
    • Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations 

      Onabajo, M.; Gómez Salinas, Dídac; Aldrete Vidrio, Eduardo; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (2011-06)
      Article
      Accés restringit per política de l'editorial
      Built-in test and on-chip calibration features are becoming essential for reliable wireless connectivity of next generation devices suffering from increasing process variations in CMOS technologies. This paper contains ...
    • Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits 

      Mateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Dídac; Aragonès Cervera, Xavier (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      This paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon ...
    • Temperature sensors and measurements to test analogue circuits: questions and answers 

      Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ...
    • Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; González Jiménez, José Luis; Martineau, B.; Siligaris, Alexandre; Aragonès Cervera, Xavier (2014-04)
      Article
      Accés restringit per política de l'editorial
      This letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The ...
    • Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor (2010)
      Text en actes de congrés
      Accés obert
      In this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits.
    • Using temperature as observable of the frequency response of RF CMOS amplifiers 

      Aldrete Vidrio, Héctor; Slhi, M A; Altet Sanahujes, Josep; Gruby, S; Mateo Peña, Diego; Michel, H; Clerjaud, L; Rampnous, J M; Rubio Sola, Jose Antonio; Claeys, Wilfrid; Dilhaire, W Claeys I S (Institute of Electrical and Electronics Engineers (IEEE), 2008)
      Text en actes de congrés
      Accés obert
      The power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ...
    • Using temperature measurements to enhance security in front of hardware trojans 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier (2023-06-28)
      Report de recerca
      Accés obert
      The goal of this document is to present a review of the work performed to carry out the task 3.5 of the Spanish National Project PID2019-103869RB-C33, entitled “El Reto de la Variabilidad en NANO-CMOS y BEYOND-CMOS: Nuevos ...
    • VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits 

      Méndez Villegas, Miguel Ángel; Osorio Tamayo, Juan Felipe; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
      Text en actes de congrés
      Accés obert
      This paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...