Exploració per autor "Mateo Peña, Diego"
Ara es mostren els items 46-63 de 63
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Non-invasive Monitoring of CMOS Power Amplifiers Operating at RF and mmW Frequencies using an On-chip Thermal Sensor
González Jiménez, José Luis; Martineau, Baudouin; Mateo Peña, Diego; Altet Sanahujes, Josep (IEEE Press. Institute of Electrical and Electronics Engineers, 2011)
Text en actes de congrés
Accés restringit per política de l'editorialIn this paper a non-invasive, contact-less technique for the on-chip observation of PA operation is presented. It uses a differential temperature sensor that transduces the temperature increase due to the power dissipated ... -
Non-invasive RF built-in testing using on-chip temperature sensors
Aldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (IEEE Computer Society Publications, 2009-11)
Altres
Accés obertThis poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors. -
On evaluating temperature as observable for CMOS technology variability
Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
Text en actes de congrés
Accés obertThe temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ... -
On line monitoring of RF power amplifiers with embedded temperature sensors
Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac (IEEE, 2012)
Text en actes de congrés
Accés restringit per política de l'editorialIn the present paper we analyze that DC temperature measurements of the silicon surface can be used to monitor the high frequency status and performances of class A RF Power Amplifiers. As a proof of concept, we present ... -
On the use of static temperature measurements as process variation observable
Gómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego (2012-10)
Article
Accés restringit per política de l'editorialIn this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, ... -
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling
Méndez, M A; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (IEEE, 2005)
Text en actes de congrés
Accés obertThe present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the ... -
Providing an UWB-IR BAN wireless communications network and its application to design a low power transceiver in CMOS technology
Barajas Ojeda, Enrique; Mateo Peña, Diego; González Jiménez, José Luis (Universitat Politècnica de Catalunya, 2010)
Text en actes de congrés
Accés obertUltra Wide-Band (UWB) communication techniques have received increasing attention since United States Federal Communications Commission (FCC) adopted a “First Report and Order” in 2002. Unfortunately the regulations that ... -
Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes
Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
Text en actes de congrés
Accés restringit per política de l'editorialThis paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ... -
Sargantana: an academic SoC RISC-V processor in 22nm FDSOI technology
Doblas Font, Max; Candón Arenas, Gerard; Carril Gil, Xavier; Dominguez de la Rocha, Marc; Erra, Enric; González Trejo, Alberto; Jiménez, Víctor; Kostalampros, Ioannis-Vatistas; Langarita Benítez, Rubén; Leyva Santes, Neiel; López Paradís, Guillem; Mendoza Escobar, Jonnatan; Oltra Oltra, Josep Angel; Pavón Rivera, Julián; Ramírez Lazo, Cristóbal; Rodas Quiroga, Narcís; Reggiani, Enrico; Rodriguez, Mario; Rojas Morales, Carlos; Ruiz Ramirez, Abraham Josafat; Safadi Figueroa, Hugo Ernesto; Soria Pardos, Víctor; Vargas Valdivieso, Iván; Arreza, Fernando; Figueras Bagué, Roger; Fontova Muste, Pau; Marimon Illana, Joan; Aragonès Cervera, Xavier; Cristal Kestelman, Adrián; Mateo Peña, Diego; Moll Echeto, Francisco de Borja; Moretó Planas, Miquel; Palomar Pérez, Óscar; Sonmez, Nehir; Unsal, Osman Sabri; Valero Cortés, Mateo (Institute of Electrical and Electronics Engineers (IEEE), 2023)
Comunicació de congrés
Accés obertThis paper describes the Sargantana System on chip (SoC), a 64-bit RISC-V single core processor designed by a number of academic institutions and manufactured in 22 nm FDSOI technology: BSC, UPC, UB, UAB, CIC-IPN and IMB-CNM ... -
Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements
Aldrete Vidrio, Eduardo; Mateo Peña, Diego; Altet Sanahujes, Josep; Amine Salhi, M.; Grauby, Stéphane; Dilhaire, Stefan; Onabajo, M.; Silva-Martínez, José (2010-06-08)
Article
Accés obertThis paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and ... -
Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations
Onabajo, M.; Gómez Salinas, Dídac; Aldrete Vidrio, Eduardo; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (2011-06)
Article
Accés restringit per política de l'editorialBuilt-in test and on-chip calibration features are becoming essential for reliable wireless connectivity of next generation devices suffering from increasing process variations in CMOS technologies. This paper contains ... -
Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits
Mateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Dídac; Aragonès Cervera, Xavier (2013)
Text en actes de congrés
Accés restringit per política de l'editorialThis paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon ... -
Temperature sensors and measurements to test analogue circuits: questions and answers
Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
Text en actes de congrés
Accés restringit per política de l'editorialWe have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ... -
Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers
Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; González Jiménez, José Luis; Martineau, B.; Siligaris, Alexandre; Aragonès Cervera, Xavier (2014-04)
Article
Accés restringit per política de l'editorialThis letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The ... -
Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits
Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor (2010)
Text en actes de congrés
Accés obertIn this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits. -
Using temperature as observable of the frequency response of RF CMOS amplifiers
Aldrete Vidrio, Héctor; Slhi, M A; Altet Sanahujes, Josep; Gruby, S; Mateo Peña, Diego; Michel, H; Clerjaud, L; Rampnous, J M; Rubio Sola, Jose Antonio; Claeys, Wilfrid; Dilhaire, W Claeys I S (Institute of Electrical and Electronics Engineers (IEEE), 2008)
Text en actes de congrés
Accés obertThe power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ... -
Using temperature measurements to enhance security in front of hardware trojans
Altet Sanahujes, Josep; Mateo Peña, Diego; Barajas Ojeda, Enrique; Aragonès Cervera, Xavier (2023-06-28)
Report de recerca
Accés obertThe goal of this document is to present a review of the work performed to carry out the task 3.5 of the Spanish National Project PID2019-103869RB-C33, entitled “El Reto de la Variabilidad en NANO-CMOS y BEYOND-CMOS: Nuevos ... -
VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits
Méndez Villegas, Miguel Ángel; Osorio Tamayo, Juan Felipe; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
Text en actes de congrés
Accés obertThis paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...