Exploració per autor "Barcons Xixons, Víctor"

Periodicity in bimodal atomic force microscopy

Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
Article
Accés obert

Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ...

Probing power laws in multifrequency AFM

Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-02-17)
Article
Accés obert

Quantification of conservative forces in multifrequency atomic force microscopy requires solving the general equations of the theory expressed in terms of the virials of interaction. Power law expressions are commonly ...

Quantification of dissipation and deformation in ambient atomic force microscopy

Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
Article
Accés restringit per política de l'editorial

A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ...

Quantification of van der Waals forces in bimodal and trimodal AFM

Santos, Sergio; Gadelrab, Karim Raafat; Elsherbiny, Lamiaa; Drexler, Xavier; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-05-28)
Article
Accés restringit per política de l'editorial

The multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The ...