Ara es mostren els items 4-23 de 49

    • Cantilever dynamics in amplitude modulation AFM: continuous and discontinuous transitions 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2010-06-21)
      Article
      Accés obert
      Transitions between the attractive and the repulsive force regimes for amplitude modulation atomic force microscopy (AFM) can be either discontinuous, with a corresponding jump in amplitude and phase, or continuous and ...
    • Contribució a la caracterització del microscopi de força atòmica 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2013-10-31)
      Tesi
      Accés obert
      Des de la seva creació, el microscopi de força atòmica (AFM) ha estat àmpliament utilitzat sobretot per la caracterització de superfícies, obtenint imatges topogràfiques amb una resolució espacial de l’ordre o fins i tot ...
    • Deconstructing the governing dissipative phenomena in the nanoscale 

      Santos Hernández, Sergio; Amadei, Carlo Alberto; Tang, Tzu-Chieh; Barcons Xixons, Víctor; Chiesa, Matteo (2014-01)
      Report de recerca
      Accés obert
      An expression describing the controlling parameters involved in short range nanoscale dissipation is proposed and supported by simulations and experimental findings. The expression is deconstructed into the geometrical, ...
    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-05-31)
      Examen
      Accés restringit per decisió de l'autor
    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-06-21)
      Examen
      Accés restringit per decisió de l'autor
    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-06-21)
      Examen
      Accés restringit per decisió de l'autor
    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-04-05)
      Examen
      Accés restringit per decisió de l'autor
    • Energy dissipation in the presence of sub-harmonic excitation in dynamic atomic force microscopy 

      Chiesa, Matteo; Gadelrab, Karim Raafat; Verdaguer, Albert; Segura, Juan José; Barcons Xixons, Víctor; Thomson, Neil H.; Phillips, M.A.; Stefancich, M.; Santos Hernández, Sergio (2012-09)
      Article
      Accés obert
      Amplitude modulation atomic force microscopy allows quantifying energy dissipation in the nanoscale with great accuracy with the use of analytical expressions that account for the fundamental frequency and higher harmonics. ...
    • Establishing nanoscale heterogeneity with nanoscale force measurements 

      Chang, Yun-Hsiang, Yun-Hsiang; Olukan, Tuza; Lai, Chia-Yun; Santos, Sergio; Lin, Tze-Yu; Apostoleris, Harry; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2015-08-13)
      Article
      Accés obert
      Establishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters ...
    • How localized are energy dissipation processes in nanoscale interactions? 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Verdaguer, Albert; Font Teixidó, Josep; Thomson, Neil H.; Chiesa, Mateo (2011-07-29)
      Article
      Accés obert
      We describe fundamental energy dissipation in dynamic nanoscale processes in terms of the localization of the interactions. In this respect, the areal density of the energy dissipated and the effective area of interaction ...
    • Investigation of nanoscale interactions by means of subharmonic excitation 

      Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
      Article
      Accés restringit per política de l'editorial
      Multifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ...
    • Machine learning assisted multifrequency AFM: Force model prediction 

      Elsherbiny, Lamiaa; Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (American Institute of Physics (AIP), 2023-12-05)
      Article
      Accés obert
      Multifrequency atomic force microscopy (AFM) enhances resolving power, provides extra contrast channels, and is equipped with a formalism to quantify material properties pixel by pixel. On the other hand, multifrequency ...
    • Periodicity in bimodal atomic force microscopy 

      Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
      Article
      Accés obert
      Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ...
    • Probing power laws in multifrequency AFM 

      Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-02-17)
      Article
      Accés obert
      Quantification of conservative forces in multifrequency atomic force microscopy requires solving the general equations of the theory expressed in terms of the virials of interaction. Power law expressions are commonly ...
    • Quantification of dissipation and deformation in ambient atomic force microscopy 

      Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
      Article
      Accés restringit per política de l'editorial
      A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ...
    • Quantification of van der Waals forces in bimodal and trimodal AFM 

      Santos, Sergio; Gadelrab, Karim Raafat; Elsherbiny, Lamiaa; Drexler, Xavier; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-05-28)
      Article
      Accés restringit per política de l'editorial
      The multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The ...
    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2023-06-23)
      Examen
      Accés restringit per decisió de l'autor
    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-04-20)
      Examen
      Accés restringit per decisió de l'autor
    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-06-01)
      Examen
      Accés restringit per decisió de l'autor
    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-05-31)
      Examen
      Accés restringit per decisió de l'autor