Exploració per autor "Barcons Xixons, Víctor"
Ara es mostren els items 4-23 de 49
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Cantilever dynamics in amplitude modulation AFM: continuous and discontinuous transitions
Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2010-06-21)
Article
Accés obertTransitions between the attractive and the repulsive force regimes for amplitude modulation atomic force microscopy (AFM) can be either discontinuous, with a corresponding jump in amplitude and phase, or continuous and ... -
Contribució a la caracterització del microscopi de força atòmica
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2013-10-31)
Tesi
Accés obertDes de la seva creació, el microscopi de força atòmica (AFM) ha estat àmpliament utilitzat sobretot per la caracterització de superfícies, obtenint imatges topogràfiques amb una resolució espacial de l’ordre o fins i tot ... -
Deconstructing the governing dissipative phenomena in the nanoscale
Santos Hernández, Sergio; Amadei, Carlo Alberto; Tang, Tzu-Chieh; Barcons Xixons, Víctor; Chiesa, Matteo (2014-01)
Report de recerca
Accés obertAn expression describing the controlling parameters involved in short range nanoscale dissipation is proposed and supported by simulations and experimental findings. The expression is deconstructed into the geometrical, ... -
ELECTRONIC SYSTEMS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-05-31)
Examen
Accés restringit per decisió de l'autor -
ELECTRONIC SYSTEMS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-06-21)
Examen
Accés restringit per decisió de l'autor -
ELECTRONIC SYSTEMS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-06-21)
Examen
Accés restringit per decisió de l'autor -
ELECTRONIC SYSTEMS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-04-05)
Examen
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Energy dissipation in the presence of sub-harmonic excitation in dynamic atomic force microscopy
Chiesa, Matteo; Gadelrab, Karim Raafat; Verdaguer, Albert; Segura, Juan José; Barcons Xixons, Víctor; Thomson, Neil H.; Phillips, M.A.; Stefancich, M.; Santos Hernández, Sergio (2012-09)
Article
Accés obertAmplitude modulation atomic force microscopy allows quantifying energy dissipation in the nanoscale with great accuracy with the use of analytical expressions that account for the fundamental frequency and higher harmonics. ... -
Establishing nanoscale heterogeneity with nanoscale force measurements
Chang, Yun-Hsiang, Yun-Hsiang; Olukan, Tuza; Lai, Chia-Yun; Santos, Sergio; Lin, Tze-Yu; Apostoleris, Harry; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2015-08-13)
Article
Accés obertEstablishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters ... -
How localized are energy dissipation processes in nanoscale interactions?
Santos Hernández, Sergio; Barcons Xixons, Víctor; Verdaguer, Albert; Font Teixidó, Josep; Thomson, Neil H.; Chiesa, Mateo (2011-07-29)
Article
Accés obertWe describe fundamental energy dissipation in dynamic nanoscale processes in terms of the localization of the interactions. In this respect, the areal density of the energy dissipated and the effective area of interaction ... -
Investigation of nanoscale interactions by means of subharmonic excitation
Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
Article
Accés restringit per política de l'editorialMultifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ... -
Machine learning assisted multifrequency AFM: Force model prediction
Elsherbiny, Lamiaa; Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (American Institute of Physics (AIP), 2023-12-05)
Article
Accés obertMultifrequency atomic force microscopy (AFM) enhances resolving power, provides extra contrast channels, and is equipped with a formalism to quantify material properties pixel by pixel. On the other hand, multifrequency ... -
Periodicity in bimodal atomic force microscopy
Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
Article
Accés obertPeriodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ... -
Probing power laws in multifrequency AFM
Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-02-17)
Article
Accés obertQuantification of conservative forces in multifrequency atomic force microscopy requires solving the general equations of the theory expressed in terms of the virials of interaction. Power law expressions are commonly ... -
Quantification of dissipation and deformation in ambient atomic force microscopy
Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
Article
Accés restringit per política de l'editorialA formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ... -
Quantification of van der Waals forces in bimodal and trimodal AFM
Santos, Sergio; Gadelrab, Karim Raafat; Elsherbiny, Lamiaa; Drexler, Xavier; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-05-28)
Article
Accés restringit per política de l'editorialThe multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The ... -
SISTEMES ELECTRÒNICS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2023-06-23)
Examen
Accés restringit per decisió de l'autor -
SISTEMES ELECTRÒNICS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-04-20)
Examen
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SISTEMES ELECTRÒNICS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-06-01)
Examen
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SISTEMES ELECTRÒNICS
Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-05-31)
Examen
Accés restringit per decisió de l'autor