Exploració per autor "Font Teixidó, Josep"
Ara es mostren els items 9-16 de 16
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Quantification of van der Waals forces in bimodal and trimodal AFM
Santos, Sergio; Gadelrab, Karim Raafat; Elsherbiny, Lamiaa; Drexler, Xavier; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-05-28)
Article
Accés restringit per política de l'editorialThe multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The ... -
Single cycle and transient force measurements in dynamic atomic force microscopy
Gadelrab, Karim Raafat; Santos, Sergio; Font Teixidó, Josep; Chiesa, Matteo (2013-11-21)
Article
Accés obertThe monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments ... -
Spatial horizons in amplitude and frequency modulation atomic force microscopy
Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
Article
Accés obertIn dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ... -
Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging
Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H. (2013)
Article
Accés obertA way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 ... -
The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features
Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Font Teixidó, Josep; Thomson, Neil H. (2011)
Article
Accés obert -
The Mendeleev-Meyer force project
Santos Hernández, Sergio; Lai, Chia-Yun; Amadei, Carlo Alberto; Gadelrab, Karim Raafat; Tang, Tzu-Chieh; Verdaguer Prats, Albert; Barcons Xixons, Víctor; Font Teixidó, Josep; Colchero, Jaimer; Chiesa, Matteo (2016-10-28)
Article
Accés obertHere we present the Mendeleev–Meyer Force Project which aims at tabulating all materials and substances in a fashion similar to the periodic table. The goal is to group and tabulate substances using nanoscale force footprints ... -
Unlocking higher harmonics in atomic force microscopy with gentle interactions
Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Verdaguer Prats, Albert (2014-03-11)
Article
Accés obertIn dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, ... -
Wearing a single DNA molecule with an AFM tip
Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2015-06)
Report de recerca
Accés obertWhile the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is ...