Ara es mostren els items 7-16 de 16

    • Machine learning assisted multifrequency AFM: Force model prediction 

      Elsherbiny, Lamiaa; Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (American Institute of Physics (AIP), 2023-12-05)
      Article
      Accés obert
      Multifrequency atomic force microscopy (AFM) enhances resolving power, provides extra contrast channels, and is equipped with a formalism to quantify material properties pixel by pixel. On the other hand, multifrequency ...
    • Probing power laws in multifrequency AFM 

      Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-02-17)
      Article
      Accés obert
      Quantification of conservative forces in multifrequency atomic force microscopy requires solving the general equations of the theory expressed in terms of the virials of interaction. Power law expressions are commonly ...
    • Quantification of van der Waals forces in bimodal and trimodal AFM 

      Santos, Sergio; Gadelrab, Karim Raafat; Elsherbiny, Lamiaa; Drexler, Xavier; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-05-28)
      Article
      Accés restringit per política de l'editorial
      The multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The ...
    • Single cycle and transient force measurements in dynamic atomic force microscopy 

      Gadelrab, Karim Raafat; Santos, Sergio; Font Teixidó, Josep; Chiesa, Matteo (2013-11-21)
      Article
      Accés obert
      The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments ...
    • Spatial horizons in amplitude and frequency modulation atomic force microscopy 

      Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
      Article
      Accés obert
      In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ...
    • Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H. (2013)
      Article
      Accés obert
      A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 ...
    • The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Font Teixidó, Josep; Thomson, Neil H. (2011)
      Article
      Accés obert
    • The Mendeleev-Meyer force project 

      Santos Hernández, Sergio; Lai, Chia-Yun; Amadei, Carlo Alberto; Gadelrab, Karim Raafat; Tang, Tzu-Chieh; Verdaguer Prats, Albert; Barcons Xixons, Víctor; Font Teixidó, Josep; Colchero, Jaimer; Chiesa, Matteo (2016-10-28)
      Article
      Accés obert
      Here we present the Mendeleev–Meyer Force Project which aims at tabulating all materials and substances in a fashion similar to the periodic table. The goal is to group and tabulate substances using nanoscale force footprints ...
    • Unlocking higher harmonics in atomic force microscopy with gentle interactions 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Verdaguer Prats, Albert (2014-03-11)
      Article
      Accés obert
      In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, ...
    • Wearing a single DNA molecule with an AFM tip 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2015-06)
      Report de recerca
      Accés obert
      While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is ...