Exploració per autor "Figueras Pàmies, Joan"Més informació

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    • SRAM cell stability metric under transient voltage noise 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2013-12-20)
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    • SRAM stability metric under transient noise 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2012)
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      ventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like process and mi smatch variations, bulk noises, supply rings variations, ...

    • Statistical analysis of SRAM aarametric failure under supply voltage scaling 

      Vatajelu, Elena Ioana; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2010)
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    • Structural and functional fault-tolerance evaluation of local area networks 

      Carrasco, Juan A.; Figueras Pàmies, Joan (1985)
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      Fault tolerance attributes of Local Area Networks (LAN) have been evaluated in their structural (topologies) and functional (protocols) aspects. In relation to structural faults, a fault model has been developed and five ...

    • STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations 

      Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Indaco, Marco; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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      The CMOS based memories are facing major issues with technology scaling, such as decreased reliability and increased leakage power. A point will be reached when the technology scaling issues will overweight the benefits. ...

    • Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current Sensors 

      Wunderlich, H J; Herzog, M; Figueras Pàmies, Joan; Carrasco, Juan A.; Calderón, A (1995)
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      "On-Chip" I_{DDQ} testing by the incorporation of Built-In Current (BIC) sensors has some advantages over "off-chip" techniques. However, the integration of sensors poses analog design problems which are hard to be solved ...

    • Test of dual axis accelerometers based on specifications compliance 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Universidad de Navarra, 2013)
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    • Testing IC accelerometers using Lissajous compositions 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
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      Micro Electro Mechanical devices (MEMs) have widened their range of applications in a spectacular way in the last years. Reliability of MEMs devices is one of the areas that need to be improved to achieve high volume ...

    • Transient noise failures in SRAM cells: dynamic noise margin metric 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2011)
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      Current nanometric IC processes need to assess the robustness of memories under any possible source of disturbance: process and mismatch variations, bulk noises, supply rings variations, temperature changes, aging and ...

    • Una experiència d'investigació i desenvolupament en un entorn acadèmic: el LIDE 

      Figueras Pàmies, Joan (Universitat Politècnica de Barcelona, 1980-12)
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      En aquesta comunicació es presenta l'experiència d'un Laboratori de Càtedra durant els seus primers set anys d'existència dedicats a la recerca i desenvolu­pament tecnològic. També es proposen uns punts de reflexió que ...

    • Verifying analog circuits based on a digital signature 

      Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2009)
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      Verification of analog circuit specifications is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost parameter verification based on statistical ...