Exploració per autor "Figueras Pàmies, Joan"
Ara es mostren els items 35-51 de 51
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Quality metrics for mixed-signal indirect testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
Text en actes de congrés
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Quiescent current analysis and experimentation of defective CMOS circuits
Segura, J A; Champac, V H; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Rubio Sola, Jose Antonio (1992-12)
Article
Accés restringit per política de l'editorialPhysical defects widely encountered in today's CMOS processes (bridges, gate oxide short (gas) and floating gates) are modeled taking into account the topology of the defective circuit and the parameters of the technology. ... -
Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell
Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Indaco, Marco; Renovell, Michel; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
Text en actes de congrés
Accés restringit per política de l'editorialThe rapid development of low power, high density, high performance SoCs has pushed the embedded memories to their limits and opened the field to the development of emerging memory technologies. The Spin- Transfer-Torque ... -
Redes de ordenadores, redes de sistemas, sistemas distribuidos
Alabau Muñoz, Antonio; Figueras Pàmies, Joan (Asociación de Técnicos de Informática, 1980-11)
Article
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Reliability estimation at block-level granularity of spin-transfer-torque MRAMs
Di Carlo, Stefano; Indaco, Marco; Prinetto, Paolo; Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2014)
Text en actes de congrés
Accés restringit per política de l'editorialIn recent years, the Spin-Transfer-Torque Magnetic Random Access Memory (STT-MRAM) has emerged as a promising choice for embedded memories due to its reduced read/write latency and high CMOS integration capability. Under ... -
Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS
Vatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan (IEEE Press. Institute of Electrical and Electronics Engineers, 2010)
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SRAM cell stability metric under transient voltage noise
Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2013-12-20)
Article
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SRAM stability metric under transient noise
Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2012)
Text en actes de congrés
Accés obertventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like process and mi smatch variations, bulk noises, supply rings variations, ... -
Statistical analysis of SRAM aarametric failure under supply voltage scaling
Vatajelu, Elena Ioana; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2010)
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Structural and functional fault-tolerance evaluation of local area networks
Carrasco, Juan A.; Figueras Pàmies, Joan (1985)
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Accés obertFault tolerance attributes of Local Area Networks (LAN) have been evaluated in their structural (topologies) and functional (protocols) aspects. In relation to structural faults, a fault model has been developed and five ... -
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations
Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Indaco, Marco; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
Text en actes de congrés
Accés restringit per política de l'editorialThe CMOS based memories are facing major issues with technology scaling, such as decreased reliability and increased leakage power. A point will be reached when the technology scaling issues will overweight the benefits. ... -
Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current Sensors
Wunderlich, H J; Herzog, M; Figueras Pàmies, Joan; Carrasco, Juan A.; Calderón, A (1995)
Text en actes de congrés
Accés obert"On-Chip" I_{DDQ} testing by the incorporation of Built-In Current (BIC) sensors has some advantages over "off-chip" techniques. However, the integration of sensors poses analog design problems which are hard to be solved ... -
Test of dual axis accelerometers based on specifications compliance
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Universidad de Navarra, 2013)
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Testing IC accelerometers using Lissajous compositions
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
Text en actes de congrés
Accés restringit per política de l'editorialMicro Electro Mechanical devices (MEMs) have widened their range of applications in a spectacular way in the last years. Reliability of MEMs devices is one of the areas that need to be improved to achieve high volume ... -
Transient noise failures in SRAM cells: dynamic noise margin metric
Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2011)
Text en actes de congrés
Accés restringit per política de l'editorialCurrent nanometric IC processes need to assess the robustness of memories under any possible source of disturbance: process and mismatch variations, bulk noises, supply rings variations, temperature changes, aging and ... -
Una experiència d'investigació i desenvolupament en un entorn acadèmic: el LIDE
Figueras Pàmies, Joan (Universitat Politècnica de Barcelona, 1980-12)
Text en actes de congrés
Accés obertEn aquesta comunicació es presenta l'experiència d'un Laboratori de Càtedra durant els seus primers set anys d'existència dedicats a la recerca i desenvolupament tecnològic. També es proposen uns punts de reflexió que ... -
Verifying analog circuits based on a digital signature
Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2009)
Comunicació de congrés
Accés obertVerification of analog circuit specifications is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost parameter verification based on statistical ...