Exploració per autor "Figueras Pàmies, Joan"
Ara es mostren els items 9-28 de 51
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Criteria for indirect measurements in M-S testing
(2014)
Text en actes de congrés
Accés restringit per decisió de l'autorAnalog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog ... -
Criteria for selecting a subset of indirect measurements for analog testing
(2016)
Text en actes de congrés
Accés restringit per política de l'editorialThis work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual number of measurements to be performed to those strictly ... -
Defective Behaviour of an 8T SRAM Cell with Open Defects
(2010)
Text en actes de congrés
Accés restringit per política de l'editorial -
Diagnosis of full open defects in interconnect lines with fan-out
(IEEE Press. Institute of Electrical and Electronics Engineers, 2010-05-24)
Text en actes de congrés
Accés obertThe development of accurate diagnosis methodologies is important to solve process problems and achieve fast yield improvement. As open defects are common in CMOS technologies, accurate diagnosis of open defects becomes ... -
Diagnosis of full open defects in interconnecting lines
(IEEE, 2007-05-31)
Text en actes de congrés
Accés obertA proposal for enhancing the diagnosis of full open defects in interconnecting lines of CMOS circuits is presented. The defective line is first classified as fully opened by means of a logic-based diagnosis tool (Faloc). ... -
Digital signature generator for mixed-signal testing
(IEEE Computer Society Publications, 2009)
Text en actes de congrés
Accés obertEs presenta un nou generador de signatures digitals per controlar dues senyals anàlogues. Es presenta la tecnologia STM 65 nm per demostrar la viabilitat de la proposta. -
Efficient production binning using octree tessellation in the alternate measurements space
(2015)
Article
Accés obertBinning after volume production is a widely accepted technique to classify fabricated ICs into different clusters depending on different degrees of specification compliance. This allows the manufacturer to sell non optimal ... -
Evaluation of safety-oriented two-version architectures
(1991-03)
Article
Accés obertA Markov model taking into account physical and design faults for a two-version architecture oriented to safety-related applications is developed. Only a probabilistic knowledge of the initial state of the versions in ... -
Gate leakage impact on full open defects in interconnect lines
(2011-06)
Article
Accés obertAn Interconnect full open defect breaks the connection between the driver and the gate terminals of downstream transistors, generating a floating line. The behavior of floating lines is known to depend on several factors, ... -
Identification of component deviations in analog circuits using digital signatures
(2011)
Text en actes de congrés
Accés restringit per política de l'editorialAnalog circuits component diagnosis is a challenging task requiring expensive resources. This paper presents a low cost method to identify deviations in multiple component values using a precharacterisation of the impact ... -
Impact of gate tunnelling leakage on CMOS circuits with full open defects
(Institution of Electrical Engineers, 2007-10)
Article
Accés obertInterconnecting lines with full open defects become floating lines. In nanometric CMOS technologies, gate tunnelling leakage currents impact the behaviour of these lines, which cannot be considered electrically isolated ... -
Improving indirect test efficiency using multi-directional tessellations in the measure space
(Institute of Electrical and Electronics Engineers (IEEE), 2016)
Text en actes de congrés
Accés restringit per política de l'editorialIndirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the ... -
Indirect test of M-S circuits using multiple specification band guarding
(2016-09-01)
Article
Accés obertTesting analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ... -
La concurrencia de sistemas basados en microcomputador
(Asociación de Técnicos de Informática, 1978-01)
Article
Accés obert -
La Promoció 108 compleix 50 anys (1964-2014): història, entorn i records
(Brau, 2014-09-01)
Llibre
Accés obert -
Localization and electrical characterization of interconnect open defects
(2010-02)
Article
Accés obertA technique for extracting the electrical and topological parameters of open defects in process monitor lines is presented. The procedure is based on frequency-domain measurements performed at both end points of the ... -
M-S test based on specification validation using octrees in the measure space
(2013)
Text en actes de congrés
Accés restringit per política de l'editorialTesting M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ... -
Mixed-signal test band guarding using digitally coded indirect measurements
(Institute of Electrical and Electronics Engineers (IEEE), 2015)
Text en actes de congrés
Accés restringit per política de l'editorialTesting analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ... -
Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing
(2017-02-20)
Article
Accés restringit per política de l'editorialOne of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ... -
Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers
(2013)
Text en actes de congrés
Accés restringit per política de l'editorialMicroelectromechanical systems production is still an immature technology compared to the classical semiconductor industry. MEMS fabrication and packaging processes may present misalignments which result in an improper ...
