Ara es mostren els items 59-78 de 223

    • Edge diffraction computation using GRECO 

      Rius Casals, Juan Manuel; Carbo, Alex; Úbeda Farré, Eduard; Heldring, Alexander (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      This paper addresses two graphical processing approaches for computation of edge scattering with Physical Theory of Diffraction (PTD) high-frequency approximation. One is based on processing only a bitmap containing an ...
    • Efficient analysis of homogeneous dielectric and plasmonic media with integral equation MEI (IE-MEI) 

      Rius Casals, Juan Manuel; Planes Conangla, Gerard; Úbeda Farré, Eduard; Heldring, Alexander (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Comunicació de congrés
      Accés restringit per política de l'editorial
      This paper revisits the IE-MEI method and proposes a new formulation for high-loss dielectric piecewise-homogeneous media. The aim of this work is to assess if the fast attenuation of fields in highly lossy media helps in ...
    • Efficient analysis of sheets with nonzero thickness 

      Úbeda Farré, Eduard; Rius Casals, Juan Manuel (Institute of Electrical and Electronics Engineers (IEEE), 2021)
      Comunicació de congrés
      Accés obert
      The conventional scattering analysis of perfectly conducting plates neglects the scattering contribution of the rim in the discretization of the Electric-Field Integral Equation. This so-called thin-plate scheme manages ...
    • Efficient analysis of thick curved metal sheets 

      Úbeda Farré, Eduard; Rius Casals, Juan Manuel (Institute of Electrical and Electronics Engineers (IEEE), 2021)
      Text en actes de congrés
      Accés obert
      The scattering analysis of perfectly conducting plates with the method-of-moment discretization of the Electric-Field Integral Equation has been traditionally carried out according to the thin-sheet approximation, which ...
    • Efficient and accurate electromagnetic scattering analysis of perfectly conducting thick plates 

      Úbeda Farré, Eduard; Sekulic, Ivan; Rius Casals, Juan Manuel (Institute of Electrical and Electronics Engineers (IEEE), 2019)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      The scattering analysis with the Electric-Field Integral Equation by the Method of Moments of perfectly conducting plates is normally carried out through the thin-plate approximation, which models the closed surface as an ...
    • Efficient computation of the effect of wire ends in thin wire analysis 

      Heldring, Alexander; Úbeda Farré, Eduard; Rius Casals, Juan Manuel (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2006-10-31)
      Article
      Accés obert
      Computationally efficient algorithms are presented for the computation of the effect of flat wire ends (end caps) in the common thin wire model. A uniform charge distribution over the surface of the end cap is assumed, and ...
    • Electromagnetic monitoring of biological microorganisms 

      Zarrinkhat, Faezeh; Garrido, Alejandra; Jofre Roca, Lluís; Romeu Robert, Jordi; Rius Casals, Juan Manuel (Institute of Electrical and Electronics Engineers (IEEE), 2019)
      Comunicació de congrés
      Accés restringit per política de l'editorial
      The investigation of the electromagnetic properties of biological cells in the microwave frequencies may enable wireless monitoring of functional activity of microorganisms. Both theoretical and experimental methodologies ...
    • Enhanced discretization of surface integral equations for resonant scattering analysis of sharp-edged plasmonic nanoparticles 

      Sekulic, Ivan; Tzarouchis, Dimitrios C.; Ylä-Oijala, Pasi; Úbeda Farré, Eduard; Rius Casals, Juan Manuel (American Physical Society (APS), 2019-04-10)
      Article
      Accés obert
      The surface integral equation (SIE) method, discretized with the method of moments, is a well-established methodology for the scattering analysis of subwavelength plasmonic nanoparticles. SIEs are usually discretized with ...
    • Estudio de las prestaciones de contra-contra-medidas radar en entornos ruidosos 

      Rius Casals, Juan Manuel; Elias Fusté, Antoni; Calvo, S (Unión Científica Internacional de Radio (URSI), 1989)
      Text en actes de congrés
      Accés obert
      A Multiplier-Convolution-Multiplier (M.C.M.) processor behaves as a frequency-time converter. A computer simulation study is made to analize the performance of this device in a noisy environment. Own to its compressive ...
    • Examen Final 

      Dios Otín, Víctor Federico; Rius Casals, Juan Manuel (Universitat Politècnica de Catalunya, 2021-01-18)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastián (Universitat Politècnica de Catalunya, 2020-06-19)
      Examen
      Accés restringit a la comunitat UPC
    • Examen final 

      Dios Otín, Víctor Federico; Rius Casals, Juan Manuel (Universitat Politècnica de Catalunya, 2022-01)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Rius Casals, Juan Manuel; Romeu Robert, Jordi (Universitat Politècnica de Catalunya, 2014-01-20)
      Examen
      Accés restringit a la comunitat UPC
    • EXAMEN FINAL 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastián (Universitat Politècnica de Catalunya, 2017-06-19)
      Examen
      Accés restringit a la comunitat UPC
    • EXAMEN FINAL 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastián (Universitat Politècnica de Catalunya, 2022-05-30)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastián (Universitat Politècnica de Catalunya, 2023-06-01)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final: test i problemes 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastián (Universitat Politècnica de Catalunya, 2015-06-22)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final: test i problemes 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastia (Universitat Politècnica de Catalunya, 2018-06-15)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final: test i problemes 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastia (Universitat Politècnica de Catalunya, 2019-06-21)
      Examen
      Accés restringit a la comunitat UPC
    • Examen Final: test i problemes 

      Rius Casals, Juan Manuel; Blanch Boris, Sebastián (Universitat Politècnica de Catalunya, 2016-10-04)
      Examen
      Accés restringit a la comunitat UPC