Exploració per autor "Dufis, Cédric Yvan"

Ara es mostren els items 9-9 de 9

    • On evaluating temperature as observable for CMOS technology variability 

      Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
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      The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ...