Exploració per autor "Dufis, Cédric Yvan"
Ara es mostren els items 1-9 de 9
-
CATRENE-PANAMA project review June 2010
González Jiménez, José Luis; Dufis, Cédric Yvan (2010-06-03)
Report de recerca
Accés restringit per acord de confidencialitatInforme de progrés del projecte Europeu CATRENE-PANAMA sobre les tasques desenvolupades per el grup de recerca HiPICS de la UPC -
CATRENE-PANAMA project review November 2010
González Jiménez, José Luis; Dufis, Cédric Yvan (2010-11-23)
Report de recerca
Accés restringit per acord de confidencialitatInforme de progrés del projecte Europeu CATRENE-PANAMA sobre les tasques desenvolupades per el grup de recerca HiPICS de la UPC -
CATRENE-PANAMA WP1: integrated PA Milestone M1.3 technology, approach & system choice for home networking
Dufis, Cédric Yvan; Mateo Peña, Diego; Bofill, Adrià; González Jiménez, José Luis (2009-10-30)
Report de recerca
Accés obert -
Design of a wideband class-A power amplifier for wireline communication
Dufis, Cédric Yvan; González Jiménez, José Luis (2010)
Text en actes de congrés
Accés restringit per política de l'editorialThis paper introduce a design review of a wideband Power Amplifier with a 65nm CMOS technology. The Integrated Circuit has to work from 300MHz to 2:5GHz with external components adapted to a specific band. A 2.5D simulation ... -
Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC
Altet Sanahujes, Josep; González Jiménez, José Luis; Gómez Salinas, Dídac; Perpiñà, Xavier; Grauby, Stephane; Dufis, Cédric Yvan; Vellvehi, Miquel; Mateo Peña, Diego; Dilhaire, Stefan; Jordà, Xavier (2012)
Text en actes de congrés
Accés restringit per política de l'editorialThis paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the ch aracteristics of temperature sensors embedded in a integrated circuit ... -
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers
Altet Sanahujes, Josep; González, José Luis; Gómez Salinas, Dídac; Perpiñà Gilabet, Xavier; Claeys, Wilfrid; Grauby, Stéphane; Dufis, Cédric Yvan; Vellvehi, Miquel; Mateo Peña, Diego; Reverter Cubarsí, Ferran; Dilhaire, Stefan; Jordà, Xavier (2014-05)
Article
Accés restringit per política de l'editorialThis paper reports on the design solutions and the different measurements we have done in order to characterize the thermal coupling and the performance of differential temperature sensors embedded in an integrated circuit ... -
Electro-thermal coupling analysis methodology for RF circuits
Gómez Salinas, Didac; Dufis, Cédric Yvan; Altet Sanahujes, Josep; Mateo Peña, Diego; González Jiménez, José Luis (2012-09)
Article
Accés restringit per política de l'editorialIn this paper an electro-thermal co-simulation methodology suitable for RF circuits is presented. It circumvents traditional transient simulation drawbacks that arise when signals or magnitudes whose frequencies are separated ... -
Inforrme de la segona anualitat del projecte CATRENE-PANAMA per al programa AVANZA I+D
González Jiménez, José Luis; Dufis, Cédric Yvan (2011-03-16)
Report de recerca
Accés restringit per acord de confidencialitatInforme de les tasques i activitats desenvolupades al projecte europeu CATRENE-PANAMA durant l'any 2010 per el grup de recerca de la UPC HiPICS -
On evaluating temperature as observable for CMOS technology variability
Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
Text en actes de congrés
Accés obertThe temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ...