• A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip 

      Suñé, Víctor; Rodríguez Montañés, Rosa; Carrasco, Juan A.; Munteanu, D-P (2003)
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      In this paper we develop a combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip. The method assumes that defects are produced according to a model in which defects are lethal and affect given ...