E-prints UPC >

Llistant per Autor Gómez Pau, Álvaro

Vista preliminar	Data	Títol	Autor(s)
	2012	Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.	Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
	2009	Digital signature generator for mixed-signal testing	Sanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
	2011	Identification of component deviations in analog circuits using digital signatures	Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
	2013	Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers	Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
	2012	SRAM stability metric under transient noise	Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
	2011	Testing IC accelerometers using Lissajous compositions	Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
	2011	Transient noise failures in SRAM cells: dynamic noise margin metric	Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
	2009	Verifying analog circuits based on a digital signature	Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan