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Llistant per Autor Maya Sánchez, Mª del Carmen

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Mostrant resultats 1 a 7 de 7
Vista preliminarDataTítolAutor(s)
method characterizing coplanar105561364.pdf.jpg2003A method for characterizing coplanar waveguide-to-microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobesMaya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís; Paco, D. de
method determination distributed107638287.pdf.jpg2003A Method for the Determination of a Distributed FET Noise-Model Based on Matched-Source Noise-Figure MeasurementsMaya Sánchez, Mª del Carmen; Pradell i Cara, Lluís; Lázaro Guillén, Antoni
method simultaneously extract112598795.pdf.jpg2006A Method to Simultaneously Extract the Small-Signal Equivalent Circuit and Noise Parameters of Heterojunction Bipolar TransistorsMaya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís
bias-dependence fet105056863.pdf.jpg2003Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D modelLázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís
extraction avalanche diode104535657.pdf.jpg2003Extraction of an avalanche diode noise model for its application as on-wafer noise sourceMaya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís
Microwave Journal - March 2002.pdf.jpg2002Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sourcesLázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís
noise model reverse106599546.pdf.jpg2003Noise model of a reverse-biased Cold-FET applied to the characterization of its ENRMaya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís
Mostrant resultats 1 a 7 de 7

 

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