E-prints UPC >

Llistant per Autor Maya Sánchez, Mª del Carmen

Vista preliminar	Data	Títol	Autor(s)
	2003	A method for characterizing coplanar waveguide-to-microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobes	Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís; Paco, D. de
	2003	A Method for the Determination of a Distributed FET Noise-Model Based on Matched-Source Noise-Figure Measurements	Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís; Lázaro Guillén, Antoni
	2006	A Method to Simultaneously Extract the Small-Signal Equivalent Circuit and Noise Parameters of Heterojunction Bipolar Transistors	Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís
	2003	Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model	Lázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís
	2003	Extraction of an avalanche diode noise model for its application as on-wafer noise source	Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís
	2002	Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources	Lázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís
	2003	Noise model of a reverse-biased Cold-FET applied to the characterization of its ENR	Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís