E-prints UPC >

Llistant per Autor Vatajelu, Elena Ioana

Vista preliminar	Data	Títol	Autor(s)
	2010	Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic Analysis	Vatajelu, Elena Ioana; Panagopoulos, Georgios; Roy, Kaushik; Figueras Pàmies, Joan
	1-mar-2012	Process variability in sub-16nm bulk CMOS technology	Rubio Sola, Jose Antonio; Figueras Pàmies, Joan; Vatajelu, Elena Ioana; Canal Corretger, Ramon
	2010	Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS	Vatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan
	2012	SRAM stability metric under transient noise	Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
	2010	Statistical analysis of SRAM aarametric failure under supply voltage scaling	Vatajelu, Elena Ioana; Figueras Pàmies, Joan
	2011	Transient noise failures in SRAM cells: dynamic noise margin metric	Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan