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Llistant per Autor Berbel Artal, Néstor

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Mostrant resultats 1 a 13 de 13
Vista preliminarDataTítolAutor(s)
EMC_COMPO_IA_Modelling_final.pdf.jpg2012An alternative approach to model the internal activity of integrated circuits.Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio; Li, Binhong; BenDhia, S.; Boyer, A.
1-ago-2014Characterization and modeling of the conducted emission of integrated circuits up to 3 GHzBerbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
Piers 2010 Ver Finale.pdf.jpg2011Characterization and modeling of the electromagnetic emission of an ADC converterBerbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
2013Characterization of conducted emission at high frequency under different temperatureBerbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
2009Diseño de un entorno educativo heterogéneo de buses de campo y supervisión remota para procesos de automatización industrialMedina Garcia, José Luis; Gallardo León, Juan Antonio; Berbel Artal, Néstor; Salvador Sola, Antonio
05729193.pdf.jpg2010EMI model of an AC/AC power converterEspina Masramon, Jorge; Balcells Sendra, Josep; Arias Pujol, Antoni; Ortega García, Carlos; Berbel Artal, Néstor
18-jul-2013Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuitsBoyer, Alexandre; Dhia, Sonia Ben; Fernández García, Raúl; Berbel Artal, Néstor
8602786.pdf.jpg16-set-2011Experimental verification of the usefulness of the n-th power law MOSFET model under hot carrier wearoutBerbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio; Li, B.; Boyer, A.; BenDhia, S.
12-abr-2010Impact of NBTI on EMC behaviours of CMOS inverterFernández García, Raúl; Berbel Artal, Néstor; Gil Galí, Ignacio; Morata Cariñena, Marta
Modelling.pdf.jpgoct-2009Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverterBerbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
TCPMT-2011-025_review_FINAL.pdf.jpg10-feb-2012Reduction of electromagnetic interference susceptibility in small-signal analog circuits using complementary split-ring resonatorsPérez Robles, Daniel; Gil Galí, Ignacio; Gago Barrio, Javier; Fernández García, Raúl; Balcells Sendra, Josep; González Díez, David; Berbel Artal, Néstor; Mon González, Juan
2008Remote laboratory for training in industrial automationMedina Garcia, José Luis; Berbel Artal, Néstor; Veenhof, Nick
9139568.pdf.jpg2011Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferencesLi, Binhong; Berbel Artal, Néstor; Boyer, A.; BenDhia, S.; Fernández García, Raúl
Mostrant resultats 1 a 13 de 13

 

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