E-prints UPC >

Llistant per Autor Berbel Artal, Néstor

Vista preliminar	Data	Títol	Autor(s)
	2012	An alternative approach to model the internal activity of integrated circuits.	Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio; Li, Binhong; BenDhia, S.; Boyer, A.
	2011	Characterization and modeling of the electromagnetic emission of an ADC converter	Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
	2009	Diseño de un entorno educativo heterogéneo de buses de campo y supervisión remota para procesos de automatización industrial	Medina Garcia, José Luis; Gallardo León, Juan Antonio; Berbel Artal, Néstor; Salvador Sola, Antonio
	2010	EMI model of an AC/AC power converter	Espina Masramon, Jorge; Balcells Sendra, Josep; Arias Pujol, Antoni; Ortega García, Carlos; Berbel Artal, Néstor
	16-set-2011	Experimental verification of the usefulness of the n-th power law MOSFET model under hot carrier wearout	Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio; Li, B.; Boyer, A.; BenDhia, S.
	12-abr-2010	Impact of NBTI on EMC behaviours of CMOS inverter	Fernández García, Raúl; Berbel Artal, Néstor; Gil Galí, Ignacio; Morata Cariñena, Marta
	oct-2009	Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter	Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
	10-feb-2012	Reduction of electromagnetic interference susceptibility in small-signal analog circuits using complementary split-ring resonators	Pérez Robles, Daniel; Gil Galí, Ignacio; Gago Barrio, Javier; Fernández García, Raúl; Balcells Sendra, Josep; González Díez, David; Berbel Artal, Néstor; Mon González, Juan
	2008	Remote laboratory for training in industrial automation	Medina Garcia, José Luis; Berbel Artal, Néstor; Veenhof, Nick
	2011	Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences	Li, Binhong; Berbel Artal, Néstor; Boyer, A.; BenDhia, S.; Fernández García, Raúl