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Llistant per Autor Altet Sanahujes, Josep

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Vista preliminarDataTítolAutor(s)
2012DC temperature measurements for power gain monitoring in RF power amplifiersAltet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; Perpiñà, Xavier; Jordà, Xavier
2013Defect-oriented non-intrusive RF test using on-chip temperature sensorsAbdallah, L.; Stratigopoulos, H. G.; Mir, S.; Altet Sanahujes, Josep
abr-2013Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensorsAltet Sanahujes, Josep; Gómez, Didac; Perpinyà, X.; Mateo Peña, Diego; González, José Luis; Vellvehi, Miquel; Jordà, Xavier
2012Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS ICAltet Sanahujes, Josep; González Jiménez, José Luis; Gómez Salinas, Dídac; Perpiñà, Xavier; Grauby, Stéphane; Dufis, Cédric; Vellvehi, Miquel; Mateo Peña, Diego; Dilhaire, Stephan; Jordà, Xavier
Altet_therminic_2010_Electro-Thermal.pdf.jpg2010Electro-thermal coupling analysis methodology for RF circuitsGómez Salinas, Dídac; Mateo Peña, Diego; Altet Sanahujes, Josep
set-2002Four different approaches for the measurement of IC surface temperature: Application to thermal testingSaulnier, J B; Altet Sanahujes, Josep; Dilhaire, S; Volz, S; Rampnoux, J M; Rubio Sola, Jose Antonio; Grauby, S; Patino, L; Claeys, W
Altet_Therminic2010_High-Power.pdf.jpg2010High-power test device for package thermal assessment and validation of thermal measuremetn tecniquesJordà, Xavier; Perpiñà, Xavier; Vellvehi, Miquel; Madrid, Francesc; Altet Sanahujes, Josep
Altet_ICREA_2010_abstract_ Hot Spot.pdf.jpg2010Hot spot detection in integrated circuits laterally accessing to the substratePerpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel
Altet_therminic_2010_Hot Spot.pdf.jpg2010Hot spot detection in integrated circuits laterally accessing to their substrate using a laser beamPerpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel
LocationHotSpots.pdf.jpg2010Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effectPerpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel; Mestres, Narcís
2011Monitor strategies for variability reduction considering correlation between power and timing variabilityMauricio Ferré, Juan; Moll Echeto, Francisco de Borja; Altet Sanahujes, Josep
2011Non-invasive Monitoring of CMOS Power Amplifiers Operating at RF and mmW Frequencies using an On-chip Thermal SensorGonzález Jiménez, José Luis; Martineau, Baudouin; Mateo Peña, Diego; Altet Sanahujes, Josep
Non-invasive RF built-in testing.pdf.jpgnov-2009Non-invasive RF built-in testing using on-chip temperature sensorsAldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José
VARI2010.pdf.jpg26-mai-2010On evaluating temperature as observable for CMOS technology variabilityAltet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio
2012On line monitoring of RF power amplifiers with embedded temperature sensorsAltet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac
oct-2012On the use of static temperature measurements as process variation observableGómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego
5-feb-2013Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermographyLeón, J.; Perpiñà, Xavier; Altet Sanahujes, Josep; Vallvehi, Miquel; Jordà, Xavier
AldreteVidrioEduardo.pdf.jpg8-jun-2010Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurementsAldrete Vidrio, Eduardo; Mateo Peña, Diego; Altet Sanahujes, Josep; Amine Salhi, M.; Grauby, Stéphane; Dilhaire, Stefan; Onabajo, M.; Silva-Martínez, José
jun-2011Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variationsOnabajo, M.; Gómez Salinas, Dídac; Aldrete Vidrio, Eduardo; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José
2013Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuitsMateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Didac; Aragonès Cervera, Xavier
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