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Llistant per Autor Figueras Pàmies, Joan

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Vista preliminarDataTítolAutor(s)
dcis2011.pdf.jpg20118T SRAM Cell with Open Defects under Voltage and Timing VariationsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Castillo Muñoz, Raul
IP5_06.pdf.jpg2010Analog circuit test based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013BIST Architecture to Detect Defects in TSVs During Pre-Bond TestingArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan
getPDF.pdf.jpgfeb-2010Built-In Sensor for Signal Integrity Faults in Digital Interconnect SignalsChampac Vilela, Víctor Hugo; Avendaño, Victor; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2010Defective Behaviour of an 8T SRAM Cell with Open DefectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pàmies, Joan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
ets10_15_2.pdf.jpg24-mai-2010Diagnosis of full open defects in interconnect lines with fan-outArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram
getPDF.pdf.jpg31-mai-2007Diagnosis of full open defects in interconnecting linesRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram; Lousberg, M.; Majhi, A.K.
digital signature generator.pdf.jpg2009Digital signature generator for mixed-signal testingSanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
05638632.pdf.jpgjun-2011Gate leakage impact on full open defects in interconnect linesArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram
2011Identification of component deviations in analog circuits using digital signaturesGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
04349252.pdf.jpgoct-2007Impact of gate tunnelling leakage on CMOS circuits with full open defectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, S.; Hora, Camelia; Kruseman, B.
getPDF.pdf.jpgfeb-2010Localization and Electrical Characterization of Interconnect Open DefectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Beverloo, Willem; Vries, Dirk K. de; Eichenberger, Stefan; Volf, Paul A. J.
2013M-S test based on specification validation using octrees in the measure spaceGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013Nondestructive diagnosis of mechanical misalignments in dual axis accelerometersGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2010Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic AnalysisVatajelu, Elena Ioana; Panagopoulos, Georgios; Roy, Kaushik; Figueras Pàmies, Joan
Variability_Scenarios.pdf.jpg1-mar-2012Process variability in sub-16nm bulk CMOS technologyRubio Sola, Jose Antonio; Figueras Pàmies, Joan; Vatajelu, Elena Ioana; Canal Corretger, Ramon
2010Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVSVatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012SRAM stability metric under transient noiseVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
2010Statistical analysis of SRAM aarametric failure under supply voltage scalingVatajelu, Elena Ioana; Figueras Pàmies, Joan
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