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Llistant per Autor Rodríguez Montañés, Rosa

Vista preliminar	Data	Títol	Autor(s)
	2011	8T SRAM Cell with Open Defects under Voltage and Timing Variations	Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Castillo Muñoz, Raul
	2011	CLIL implementation at a Spanish university: A pilot experience	Aguilar Pérez, Marta; Rodríguez Montañés, Rosa; Oriol, Carlos
	2010	Defective Behaviour of an 8T SRAM Cell with Open Defects	Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pàmies, Joan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
	31-mai-2007	Diagnosis of full open defects in interconnecting lines	Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram; Lousberg, M.; Majhi, A.K.
	24-mai-2010	Diagnosis of full open defects in interconnect lines with fan-out	Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram
	-	Gate leakage impact on full open defects in interconnect lines	Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram
	2011	Lecturer and student perceptions on CLIL at a spanish university	Aguilar Pérez, Marta; Rodríguez Montañés, Rosa
	feb-2010	Localization and Electrical Characterization of Interconnect Open Defects	Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Beverloo, Willem; Vries, Dirk K. de; Eichenberger, Stefan; Volf, Paul A. J.