Exploració per tema "Circuits integrats digitals -- Proves"

Ara es mostren els items 1-2 de 2

    • Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals 

      Champac Vilela, Víctor Hugo; Avendaño, Victor; Figueras Pàmies, Joan (2010-02)
      Article
      Accés obert
      Testing of signal integrity (SI) in current high-speed ICs, requires automatic test equipment test resources at the multigigahertz range, normally not available. Furthermore, for most internal nets of state-of-the-art ...

    • Design and implementation of automatic test equipment IP module 

      Fransi Palos, Sergi; Farre Lozano, Goretti; Garcia Deiros, Lucas; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2010-05-24)
      Comunicació de congrés
      Accés restringit per política de l'editorial
      This paper presents an Intellectual Property (IP) module that includes fully functional autonomous Automatic Test Equipment (ATE). The module analyses responses from the Device Under Test (DUT) after sending test vectors ...