Exploració per tema "Circuit testing"

Ara es mostren els items 1-8 de 8

    • A digital memristor emulator for FPGA-based artificial neural networks 

      Vourkas, Ioanis; Abusleme, A.; Ntinas, V.; Sirakoulis, Georgios Ch.; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2016)
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      FPGAs are reconfigurable electronic platforms, well-suited to implement complex artificial neural networks (ANNs). To this end, the compact hardware (HW) implementation of artificial synapses is an important step to obtain ...

    • An approach to dynamic power consumption current testing of CMOS ICs 

      Segura, J A; ROCA, M; Mateo Peña, Diego; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 1995)
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      I/sub DDQ/ testing is a powerful strategy for detecting defects that do not alter the logic behavior of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some opens can ...

    • Analysis of ISSQ/IDDQ testing implementation and circuit partitioning in CMOS cell-based design 

      Rullán Ayza, Mercedes; Ferrer Ramis, Carles; Oliver, Joan; Mateo Peña, Diego; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 1996)
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      Difference between ISSQ and IDDQ testing strategies is presented, discussing the dependency of area overhead and sensing speed on the technology. The current sensor implementation style suitable for cell-based design ...

    • Automatic generation of synchronous test patterns for asynchronous circuits 

      Roig Mansilla, Oriol; Cortadella, Jordi; Peña Basurto, Marco Antonio; Pastor Llorens, Enric (Institute of Electrical and Electronics Engineers (IEEE), 1997)
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      This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exercised by applying synchronous test vectors, ...

    • CAD directions for high performance asynchronous circuits 

      Stevens, Kenneth S.; Rotem, Shai; Burns, Steven M.; Cortadella, Jordi; Ginosar, Ran; Kishinevsky, Michael; Roncken, Marly (Association for Computing Machinery (ACM), 1999)
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      This paper describes a novel methodology for high performance asynchronous design based on timed circuits and on CAD support for their synthesis using relative timing. This methodology was developed for a prototype iA32 ...

    • Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements 

      Mateo Peña, Diego; Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
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      This paper presents a technique to obtain electrical characteristics of analog and RF circuits, based on measuring temperature at the silicon surface close to the circuit under test. Experimental results validate the ...

    • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

      Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
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      This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...

    • VCO phase noise and sideband spurs due to substrate noise generated by on-chip digital circuits 

      Méndez Villegas, Miguel Ángel; Osorio Tamayo, Juan Felipe; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
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      This paper presents the effects of noise generated by realistic digital circuits on RF voltage controlled oscillators (VCO) integrated in the same silicon die. The digital noise is coupled through the common substrate and ...