• Four different approaches for the measurement of IC surface temperature: Application to thermal testing 

      Saulnier, J.B; Altet Sanahujes, Josep; Dilhaire, Stefan; Volz, S.; Rampnoux, J.M.; Rubio Sola, Jose Antonio; Grauby, S.; Patino, L.; Claeys, W. (2002-09)
      Article
      Accés restringit per política de l'editorial
      Silicon die surface temperature can be used to monitor the health state of digital and analogue integrated circuits (IC). In the present paper, four different sensing techniques: scanning thermal microscope, laser ...