Exploració per autor "Beltrán, A"
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Direct extraction of all four transistor noise parameters from 50 noise figure measurements
Lázaro Guillén, Antoni; Pradell i Cara, Lluís; Beltrán, A; O'Callaghan Castellà, Juan Manuel (Institution of Electrical Engineers, 1998-02)
Article
Accés obertA new method for measuring the four noise parameters (NPs) of a transistor is presented. It is based on the determination of its intrinsic noise matrix elements (C, ,INT, C,,7NT, Re(C,,