• CRC-based memory reliability for task-parallel HPC applications 

      Subasi, Omer; Unsal, Osman Sabri; Labarta Mancho, Jesús José; Yalcin, Gulay; Cristal Kestelman, Adrián (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Memory reliability will be one of the major concerns for future HPC and Exascale systems. This concern is mostly attributed to the expected massive increase in memory capacity and the number of memory devices in Exascale ...
    • Implementation of a low cost prototype for electrical impedance tomography based on the integrated circuit for body composition measurement AFE4300 

      Mosquera, V.H.; Arregui, A.; Bragós Bardia, Ramon; Rengifo, C. F (Scitepress, 2018)
      Text en actes de congrés
      Accés obert
      Electrical impedance tomography (EIT) is a technique of image reconstruction of the electrical conductivity distribution in a tissue or region under observation. An electrical system for EIT comprises complex hardware and ...
    • Improving early design stage timing modeling in multicore based real-time systems 

      Trilla, David; Jalle Ibarra, Javier; Fernández, Mikel; Abella Ferrer, Jaume; Cazorla Almeida, Francisco Javier (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Text en actes de congrés
      Accés obert
      This paper presents a modelling approach for the timing behavior of real-time embedded systems (RTES) in early design phases. The model focuses on multicore processors - accepted as the next computing platform for RTES - ...