Exploració per tema "Advanced technology"

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    • A detailed methodology to compute soft error rates in advanced technologies 

      Riera Villanueva, Marc; Canal Corretger, Ramon; Abella Ferrer, Jaume; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2016)
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      System reliability has become a key design aspect for computer systems due to the aggressive technology miniaturization. Errors are typically dominated by transient faults due to radiation and are strongly related to the ...

    • Modem gain-cell memories in advanced technologies 

      Amat Bertran, Esteve; Canal Corretger, Ramon; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2018)
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      With the advent of the slowdown in DRAM capacitor scaling [1] and the increased reliability problems of traditional 6T SRAM memories [2], industry and academia have looked for alternative memory cells. Among those, gain- ...