Exploració per tema "1/f noise"
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Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1995-01-31)
Article
Accés obertWe have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that ...