Exploració per tema "feature selective validation (FSV)"
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Characterization and modeling of the conducted emission of integrated circuits up to 3 GHz
(2014-08-01)
Article
Accés restringit per política de l'editorialIn this paper, an electrical model in order to predict the electromagnetic compatibility (EMC) conducted emission of integrated circuits (ICs) up to 3 GHz is presented. The electrical model predicts the behavior of the ...