Ara es mostren els items 1-10 de 10

    • Analog circuits testing using digitally coded indirect measurements 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing mixed-signal circuits is a challenging task requiring high amounts of human and technical resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform ...
    • Criteria for indirect measurements in M-S testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
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      Accés restringit per decisió de l'autor
      Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog ...
    • Criteria for selecting a subset of indirect measurements for analog testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016)
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      Accés restringit per política de l'editorial
      This work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual number of measurements to be performed to those strictly ...
    • Efficient production binning using octree tessellation in the alternate measurements space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2015)
      Article
      Accés obert
      Binning after volume production is a widely accepted technique to classify fabricated ICs into different clusters depending on different degrees of specification compliance. This allows the manufacturer to sell non optimal ...
    • Indirect test of M-S circuits using multiple specification band guarding 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016-09-01)
      Article
      Accés obert
      Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
    • M-S test based on specification validation using octrees in the measure space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ...
    • Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
      Article
      Accés restringit per política de l'editorial
      One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ...
    • Object representation by means of nonminimal division quadtrees and octrees 

      Ayala Vallespí, M. Dolors; Brunet Crosa, Pere; Juan, R.; Navazo Álvaro, Isabel (1985-01)
      Article
      Accés restringit per política de l'editorial
      Quadtree representation of two-dimensional objects is performed with a tree that describes the recursive subdivision of the more complex parts of a picture until the desired resolution is reached. At the end, all the leaves ...
    • On the cost of fixed partial match queries in K-d trees 

      Duch Brown, Amalia; Lau Laynes-Lozada, Gustavo Salvador; Martínez Parra, Conrado (2016-08-01)
      Article
      Accés obert
      Partial match queries constitute the most basic type of associative queries in multidimensional data structures such as K-d trees or quadtrees. Given a query q=(q0,…,qK-1) where s of the coordinates are specified and K-s ...
    • On the expected cost of partial match queries in random Quad-K-d trees 

      Duch Brown, Amalia; Martínez Parra, Conrado (Springer, 2024-03-04)
      Article
      Accés obert
      Quad-K-d trees introduced by Bereckzy et al. (In: Proceedings of the 11th Latin merican Theoretical Informatics Conference (LATIN). Lecture Notes in Computer Science, vol. 8392, pp. 743–754, 2014) are a generalization of ...