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  • A new probabilistic design methodology of nanoscale digital circuits 

    García Leyva, Lancelot; Calomarde Palomino, Antonio; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (IEEE Press. Institute of Electrical and Electronics Engineers, 2011)
    Conference report
    Restricted access - publisher's policy
    The continuing trends of device scaling and increase in complexity towards terascale system on chip level of integration are putting growing difficulties into several areas of design. The intrinsic variability problem is ...