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  • Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges 

    Nguyen, T. D.; O'Callaghan Castellà, Juan Manuel; Davidson, B. A.; Redwing, R. D.; Hohenwarter, G. K. G.; Nordman, J. E.; Beyer, J. B. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1995-01-31)
    Article
    Open Access
    We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that ...