Now showing items 1-8 of 8

  • Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery 

    Upasani, Gaurang; Vera, Xavier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
    Restricted access - publisher's policy
    The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling ...
  • Framework for economical error recovery in embedded cores 

    Upasani, Gaurang; Vera, Xavier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
    Restricted access - publisher's policy
    The vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and ...
  • MT-SBST: self-test optimization in multithreaded multicore architectures 

    Foutris, Nikos; Psarakis, M.; Gizopoulos, Dimitris; Apostolakis, A.; Vera, Xavier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2010)
    Conference report
    Open Access
    Instruction-based or software-based self-testing (SBST) is a scalable functional testing paradigm that has gained increasing acceptance in testing of single-threaded uniprocessors. Recent computer architecture trends towards ...
  • Online error detection and correction of erratic bits in register files 

    Vera, Xavier; Abella Ferrer, Jaume; Carretero Casado, Javier Sebastián; Chaparro Valero, Pedro Alonso; González Colás, Antonio María (2009-06)
    Conference report
    Open Access
    Aggressive voltage scaling needed for low power in each new process generation causes large deviations in the threshold voltage of minimally sized devices of the 6T SRAM cell. Gate oxide scaling can cause large transient ...
  • Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery 

    Upasani, Gaurang; Vera, Xavier; González Colás, Antonio María (IEEE Computer Society Publications, 2013)
    Conference report
    Restricted access - publisher's policy
    Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The exponential increase in the transistor count will drive the per chip fault rate sky high. New techniques for detecting ...
  • Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery 

    Upasani, Gaurang; Vera, Xavier; González Colás, Antonio María (IEEE Computer Society Publications, 2013)
    Conference report
    Restricted access - publisher's policy
    Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The exponential increase in the transistor count will drive the per chip fault rate sky high. New techniques for detecting ...
  • Selective replication: a lightweight technique for soft errors 

    Vera, Xavier; Abella Ferrer, Jaume; Carretero Casado, Javier Sebastián; González Colás, Antonio María (ACM Press. Association for Computing Machinery, 2009-12)
    Article
    Restricted access - publisher's policy
    Soft errors are an important challenge in contemporary microprocessors. Modern processors have caches and large memory arrays protected by parity or error detection and correction codes. However, today’s failure rate is ...
  • TRAMS Project: variability and reliability of SRAM memories in sub-22nm bulk-CMOS technologies 

    Canal Corretger, Ramon; Rubio Sola, Jose Antonio; ASenov, Asen; Brown, Andrew; Miranda, Miguel; Zuber, Paul; González Colás, Antonio María; Vera, Xavier (Elsevier, 2011-12-22)
    Article
    Restricted access - publisher's policy
    The TRAMS (Terascale Reliable Adaptive MEMORY Systems) project addresses in an evolutionary way the ultimate CMOS scaling technologies and paves the way for revolutionary, most promising beyond-CMOS technologies. In this ...