Now showing items 1-2 of 2

  • Electromagnetic compatibility of CMOS circuits along the lifetime 

    Fernández García, Raúl; Ruiz, José María; Gil Galí, Ignacio; Morata Cariñena, Marta (2011)
    Conference lecture
    Open Access
    The continuous scaling of CMOS circuits has set the MOSFET transistor in the nanoelectronic era. In this context, the functionality and complexity of integrated circuits (ICs) are growing up. However, the operation voltage ...
  • Ring oscillator switching noise under NBTI wearout 

    Fernández García, Raúl; Gil Galí, Ignacio; Ruiz, José María; Morata Cariñena, Marta (2011)
    Conference report
    Open Access
    In this paper the switching noise of a CMOS ring oscillator has been analysed when their pFETs are subjected to negative bias temperature instability (NBTI). The impact of pFET under NBTI has been experimentally quantified ...