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  • Robust sequential circuits design technique for low voltage and high noise scenarios 

    García Leyva, Lancelot; Rivera Dueñas, Juan; Calomarde Palomino, Antonio; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2016)
    Conference report
    Open Access
    All electronic processing components in future deep nanotechnologies will exhibit high noise level and/ or low S/N ratios because of the extreme voltage reduction and the nearly erratic nature of such devices. ...