Exploració per autor "Ergin, Oguz"
Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2007)
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Accés obertThis paper proposes the fuse, a technique to anticipate failures due to degradation in any ALU (arithmetic logic unit), and particularly in an adder. The fuse consists of a replica of the weakest transistor in the adder ...
Unsal, Osman Sabri; Tschanz, James W.; Bowman, Keith; De, Vivek; Vera Rivera, Francisco Javier; González Colás, Antonio María; Ergin, Oguz (2006-12)
Accés obertParameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace ...
Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-09)
Accés obertSoft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...
Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María; Tschanz, James W. (2008-12)
Accés obertElectromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing ...