• Compiler directed early register release 

    Jones, Timothy M.; O’Boyle, Michael F.P.; Abella Ferrer, Jaume; González Colás, Antonio María; Ergin, Oguz (Institute of Electrical and Electronics Engineers (IEEE), 2005)
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    This paper presents a novel compiler directed technique to reduce the register pressure and power of the register file by releasing registers early. The compiler identifies registers that mil only be read once and renames ...
  • Empowering a helper cluster through data-width aware instruction selection policies 

    Unsal, Osman Sabri; Ergin, Oguz; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Computer Society, 2006)
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    Narrow values that can be represented by less number of bits than the full machine width occur very frequently in programs. On the other hand, clustering mechanisms enable cost- and performance-effective scaling of processor ...
  • Exploiting narrow values for soft error tolerance 

    Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2006-07)
    Article
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    Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...
  • Fuse: A technique to anticipate failures due to degradation in ALUs 

    Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2007)
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    This paper proposes the fuse, a technique to anticipate failures due to degradation in any ALU (arithmetic logic unit), and particularly in an adder. The fuse consists of a replica of the weakest transistor in the adder ...
  • Impact of parameter variations on circuits and microarchitecture 

    Unsal, Osman Sabri; Tschanz, James W.; Bowman, Keith; De, Vivek; Vera Rivera, Francisco Javier; González Colás, Antonio María; Ergin, Oguz (2006-12)
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    Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace ...
  • Reducing soft errors through operand width aware policies 

    Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-09)
    Article
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    Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...
  • Refueling: Preventing wire degradation due to electromigration 

    Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María; Tschanz, James W. (2008-12)
    Article
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    Electromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing ...