• A detailed methodology to compute Soft Error Rates in advanced technologies 

    Riera, Marc; Canal, Ramon; Abella, Jaume; Gonzalez, Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2016-03)
    Text en actes de congrés
    Accés obert
    System reliability has become a key design aspect for computer systems due to the aggressive technology miniaturization. Errors are typically dominated by transient faults due to radiation and are strongly related to the ...
  • Estimating the rate and luminosity function of all classes of GRBs 

    Balastegui Manso, Andreu; Canal, Ramon; Ruiz-Lapuente, Pilar (2011)
    Accés restringit per política de l'editorial
    The aim of the present work is to estimate the rate and luminosity functions of short, intermediate and long gamma-ray bursts (GRBs) by fitting their intensity distributions wih parameterized explosion rates and luminosity ...