Exploració per autor "Horwat, David"
Ara es mostren els items 1-4 de 4
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Estimation of thickness of hydrothermal degraded layer in 3Y-TZP by x-ray diffraction
García Marro, Fernando; Armas Sancho, Zamir de; Horwat, David; Anglada Gomila, Marcos Juan (2010)
Comunicació de congrés
Accés restringit per política de l'editorialA method is present for estimating the thickness of monoclinic layer formed by hydrothermal degradation of zirconia doped with 3 mol % of yttria (3Y-TZP) by means of X-ray diffraction at different incidence angles. The ... -
High hardness, low Young's modulus and low friction of nanocrystalline ZrW2 Laves phase and Zr1-xWx thin films
Horwat, David; Jiménez Piqué, Emilio; Pierson, J.F.; Migot, A.; Dehmas, M.; Anglada Gomila, Marcos Juan (2012-04)
Article
Accés restringit per política de l'editorialZr1−xWx nanocrystalline films of Zr-W solid solutions and ZrW2 Laves phase were synthesized by magnetron co-sputtering. Large values of the H/E ratio up to 0.09 are observed for grain sizes in the nanometer range along ... -
High hardness, low youngs modulus and low friction of nanocrystalline ZrW 2 laves phase and Zr 1-xW x thin films
Horwat, David; Jiménez Piqué, Emilio; Pierson, J.F.; Migot, S.; Dehmas, M.; Anglada Gomila, Marcos Juan (2012)
Article
Accés restringit per política de l'editorialZr1−xWx nanocrystalline films of Zr-W solid solutions and ZrW2 Laves phase were synthesized by magnetron co-sputtering. Large values of the H/E ratio up to 0.09 are observed for grain sizes in the nanometer range along ... -
Structural and mechanical properties of Zr1-x Mox thin films: from the nano-crystalline to the amorphous state
Borroto-Ramírez, Alejandro; Bruyère, Sthepanie; Thurieau, Nicolas; Gendarme, Christine; Jiménez Piqué, Emilio; Roa Rovira, Joan Josep; Pierson, Jean Fronçois; Mücklich, Franck; Horwat, David (2017-12-30)
Article
Accés restringit per política de l'editorialZr1-xMox thin films were synthesized on glass substrates by co-sputtering molybdenum and zirconium targets in the presence of argon with x in the 0.32–0.95 range. From X-ray diffraction analyses and transmission electron ...