Now showing items 54-58 of 58

  • Validating the reliability of WCET estimates with MBPTA 

    Milutinovic, Suzana; Abella Ferrer, Jaume; Cazorla Almeida, Francisco Javier (Barcelona Supercomputing Center, 2015-05-05)
    Conference report
    Open Access
    Estimating the worst-case execution time (WCET) of tasks in a system is an important step in timing verification of critical real-time embedded systems. Measurement-Based Probabilistic Timing Analysis (MBPTA) is a novel ...
  • Variable-based multi-module data caches for clustered VLIW processors 

    Gibert Codina, Enric; Abella Ferrer, Jaume; Sánchez Navarro, Jesús; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2005)
    Conference report
    Open Access
    Memory structures consume an important fraction of the total processor energy. One solution to reduce the energy consumed by cache memories consists of reducing their supply voltage and/or increase their threshold voltage ...
  • Variations-aware circuit designs for microprocessors 

    Pons Solé, Marc; Moll Echeto, Francisco de Borja; Abella Ferrer, Jaume (2010)
    Conference lecture
    Open Access
    A new trend that is becoming dominant is to improve layout regularity so that the layouts to be printed are more repetitive and easy to manufacture. Our proposal is to push to the limit layout regularity to minimize ...
  • VCTA: A Via-Configurable Transistor Array regular fabric 

    Pons Solé, Marc; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Computer Society Publications, 2010)
    Conference report
    Open Access
    Layout regularity is introduced progressively by integrated circuit manufacturers to reduce the increasing systematic process variations in the deep sub-micron era. In this paper we focus on a scenario where layout regularity ...
  • Via-configurable transistors array: a regular design technique to improve ICs yield 

    Pons, Marc; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2007)
    Conference report
    Open Access
    Process variations are a major bottleneck for digital CMOS integrated circuits manufacturability and yield. That is why regular techniques with different degrees of regularity are emerging as possible solutions. Our ...