Now showing items 1-13 of 13

  • A novel variation-tolerant 4T-DRAM cell with enhanced soft-error tolerance 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; Alexandrescu, Dan; Costenaro, Enrico; González Colás, Antonio María; Rubio Sola, Jose Antonio (IEEE Computer Society Publications, 2012)
    Conference report
    Restricted access - publisher's policy
    In view of device scaling issues, embedded DRAM (eDRAM) technology is being considered as a strong alternative to conventional SRAM for use in on-chip memories. Memory cells designed using eDRAM technology in addition ...
  • A Novel variation-tolerant 4T-DRAM with enhance soft-error tolerance 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; Alexandrescu, Dan; Costenaro, Enrico; González Colás, Antonio María; Rubio Sola, Jose Antonio (IEEEXPLORE, 2012)
    Conference report
    Restricted access - publisher's policy
    In view of device scaling issues, embedded DRAM (eDRAM) technology is being considered as a strong alternative to conventional SRAM for use in on-chip memories. Memory cells designed using eDRAM technology in addition to ...
  • An energy-efficient and scalable eDRAM-based register file architecture for GPGPU 

    Jing, Naifeng; Shen, Yao; Lu, Yao; Ganapathy, Shrikanth; Mao, Zhigang; Guo, Minyi; Canal Corretger, Ramon; Liang, Xiaoyao (ACM, 2013)
    Conference report
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    The heavily-threaded data processing demands of streaming multiprocessors (SM) in a GPGPU require a large register file (RF). The fast increasing size of the RF makes the area cost and power consumption unaffordable for ...
  • Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2010)
    Conference report
    Restricted access - publisher's policy
    With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits. Propagation delays which decide circuit ...
  • Dynamic fine-grain body biasing of caches with latency and leakage 3T1D-based monitors 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (2011-04-15)
    External research report
    Open Access
    In this paper, we propose a dynamically tunable fine-grain body biasing mechanism to reduce active & standby leakage power in caches under process variations.
  • Effectiveness of hybrid recovery techniques on parametric failures 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2013)
    Conference report
    Restricted access - publisher's policy
    Modern day microprocessors effectively utilise supply voltage scaling for tremendous power reduction. The minimum voltage beyond which a processor cannot operate reliably is defined as V ddmin. On-chip memories like caches ...
  • Impact of positive bias temperature instability (PBTI) 

    Aymerich Capdevila, Nivard; Ganapathy, Shrikanth; Rubio Sola, Jose Antonio; Canal Corretger, Ramon; González Colás, Antonio María (2011)
    Conference report
    Restricted access - publisher's policy
    Memory circuits are playing a key role in complex multicore systems with both data and instructions storage and mailbox communication functions. There is a general concern that conventional SRAM cell based on the 6T structure ...
  • INFORMER: an integrated framework for early-stage memory robustness analysis 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; Alexandrescu, Dan; Costenaro, Eric; González Colás, Antonio María; Rubio Sola, Jose Antonio (European Interactive Digital Advertising Alliance (EDAA), 2014)
    Conference report
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    With the growing importance of parametric (process and environmental) variations in advanced technologies, it has become a serious challenge to design reliable, fast and low-power embedded memories. Adopting a variation-aware ...
  • iRMW: A low-cost technique to reduce NBTI-dependent parametric failures in L1 data caches 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
    Open Access
    Negative bias temperature instability (NBTI) is a major cause of concern for chip designers because of its inherent ability to drastically reduce silicon reliability over the lifetime of the processor. Coupled with statistical ...
  • MODEST: a model for energy estimation under spatio-temporal variability 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2010)
    Conference report
    Restricted access - publisher's policy
    Estimation of static and dynamic energy of caches is critical for high-performance low-power designs. Commercial CAD tools performing energy estimation statically are not aware of the changing operating and environmental ...
  • On the effectiveness of hybrid mechanisms on reduction of parametric failures in caches 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (2011-12-05)
    External research report
    Restricted access - publisher's policy
    In this paper, we provide an insight on the different proactive read/write assist methods (wordline boosting & adaptive body biasing) that help in preventing (and reducing) parametric failures when coupled with reactive ...
  • Reliability in the face of variability in nanometer embedded memories 

    Ganapathy, Shrikanth (Universitat Politècnica de Catalunya, 2014-04-28)
    Doctoral thesis
  • vPROBE: Variation aware post-silicon power/performance binning using embedded 3T1D cells 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (2010-09-05)
    External research report
    Open Access
    In this paper, we present an on-die post-silicon binning methodology that takes into account the effect of static and dynamic variations and categorizes every processor based on power/performance.The proposed scheme is ...