Now showing items 1-6 of 6

  • Control-flow recovery validation using microarchitectural invariants 

    Carretero Casado, Javier Sebastián; Abella Ferrer, Jaume; Vera Gómez, Javier; Chaparro Valero, Pedro Alonso (2011)
    Conference report
    Restricted access - publisher's policy
    Processors' design complexity increases with transistors' growing density. At the same time, market competence requires a decreasing time-to-market, and therefore, reduced validation time. Such time reduction imposes new ...
  • Hardware/software-based diagnosis of load-store queues using expandable activity logs 

    Carretero Casado, Javier Sebastián; Vera Rivera, Francisco Javier; Abella Ferrer, Jaume; Ramírez García, Tanausu; Monchiero, Matteo; González Colás, Antonio María (IEEE Press. Institute of Electrical and Electronics Engineers, 2011)
    Conference report
    Restricted access - publisher's policy
    The increasing device count and design complexity are posing significant challenges to post-silicon validation. Bug diagnosis is the most difficult step during post-silicon validation. Limited reproducibility and low testing ...
  • Implementing end-to-end register data-flow continuous self-test 

    Carretero Casado, Javier Sebastián; Chaparro, Pedro; Vera Rivera, Francisco Javier; Abella Ferrer, Jaume; González Colás, Antonio María (2011-08-01)
    Article
    Restricted access - publisher's policy
    While Moore's Law predicts the ability of semiconductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in that law. One concern is the verification effort ...
  • Low Vccmin fault-tolerant cache with highly predictable performance 

    Abella Ferrer, Jaume; Carretero Casado, Javier Sebastián; Chaparro Valero, Pedro Alonso; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Press. Institute of Electrical and Electronics Engineers, 2009)
    Conference report
    Restricted access - publisher's policy
    Transistors per area unit double in every new technology node. However, the electric field density and power demand grow if Vcc is not scaled. Therefore, Vcc must be scaled in pace with new technology nodes to prevent ...
  • Online error detection and correction of erratic bits in register files 

    Vera, Xavier; Abella Ferrer, Jaume; Carretero Casado, Javier Sebastián; Chaparro Valero, Pedro Alonso; González Colás, Antonio María (2009-06)
    Conference report
    Open Access
    Aggressive voltage scaling needed for low power in each new process generation causes large deviations in the threshold voltage of minimally sized devices of the 6T SRAM cell. Gate oxide scaling can cause large transient ...
  • Selective replication: a lightweight technique for soft errors 

    Vera, Xavier; Abella Ferrer, Jaume; Carretero Casado, Javier Sebastián; González Colás, Antonio María (ACM Press. Association for Computing Machinery, 2009-12)
    Article
    Restricted access - publisher's policy
    Soft errors are an important challenge in contemporary microprocessors. Modern processors have caches and large memory arrays protected by parity or error detection and correction codes. However, today’s failure rate is ...