• Comparison of on-wafer calibrations using the concept of reference impedance 

    Purroy Martín, Francesc; Pradell i Cara, Lluís (. MICROWAVE EXHIBITORS AND PUBLISHERS, 1993)
    Text en actes de congrés
    Accés obert
    A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedance of a given Network Analyzer calibration from the reflection coefficient measurement ...
  • Control automático de nivel (ALC) de un SSPA en banda Ka 

    Corbella Sanahuja, Ignasi; Purroy Martín, Francesc (1991)
    Text en actes de congrés
    Accés obert
    This communication describes the design of an Automatic Level Control (ALC) for the transmiter of a CODE (Co-operative Olympus Data Experiment) earth station. The goal of the ALC system is to keep constant the transmited ...
  • Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach 

    Pradell i Cara, Lluís; Purroy Martín, Francesc; Cáceres, M. (. MICROWAVE EXHIBITIONS AND PUBLISHERS, 1992)
    Text en actes de congrés
    Accés obert
    Network Analyzer self-calibration techniques - TRL, LMR, TAR- are developed, implemented and compared in several transmission media. A novel LMR (Line-Match-Reflect) technique based on known LINE and REFLECT Standards, is ...
  • New Theoretical Analysis of the LRRM Calibration Technique for Vector Network Analyzers 

    Purroy Martín, Francesc; Pradell i Cara, Lluís (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001-10-31)
    Article
    Accés obert
    In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to ...