Now showing items 1-5 of 5

  • A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits 

    Andrade Miceli, Dennis Michael; Calomarde Palomino, Antonio; Rubio Sola, Jose Antonio (IEEE Press. Institute of Electrical and Electronics Engineers, 2010)
    Conference report
    Open Access
    Abstract—Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits ...
  • Analysis of delay mismatching of digital circuits caused by common environmental fluctuations 

    Andrade Miceli, Dennis Michael; Calomarde Palomino, Antonio; Rubio Sola, Jose Antonio; Cotofana, Sorin (IEEE, 2011)
    Conference report
    Restricted access - publisher's policy
    Environmental conditions are changing all the time along the chip as a consequence of its own activity, provoking deviations on propagation time in digital circuits. In future technologies, the increment of devices sensitivity ...
  • New redundant logic design concept for high noise and low voltage scenarios 

    García Leyva, Lancelot; Andrade Miceli, Dennis Michael; Gómez Fernández, Sergio; Calomarde Palomino, Antonio; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2011-12)
    Article
    Restricted access - publisher's policy
    This paper presents a new redundant logia design concept named Turtle Logic(TL).It is a new probabilistic logic method based on port redundancy and complementary data, oriented toward emerging technologies beyond CMOS, ...
  • Power supply noise and logic error probability 

    Andrade Miceli, Dennis Michael; Martorell Cid, Ferran; Pons Solé, Marc; Moll Echeto, Francisco de Borja; Rubio, Antonio (2007-08)
    Conference report
    Open Access
    Voltage fluctuations caused by parasitic impedances in the power supply rails of modern ICs are a major concern in nowadays ICs. The voltage fluctuations are spread out to the diverse nodes of the internal sections causing ...
  • Voltage fluctuations in IC power supply distribution 

    Andrade Miceli, Dennis Michael; Martorell Cid, Ferran; Moll Echeto, Francisco de Borja; Rubio, Antonio (2007-11)
    Conference report
    Open Access
    The supply voltage decrease and power consumption increase of modern ICs made the requirements for low voltage fluctuation caused by packaging and on-chip parasitic impedances more difficult to achieve. Most of the research ...